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In-plane Raman scattering of [001]-grown Si/Ge superlattices

Schorer, R. and Wegscheider, Werner and Eberl, Karl and Kasper, E. and Kibbel, H. and Abstreiter, Gerhard (1992) In-plane Raman scattering of [001]-grown Si/Ge superlattices. Thin Solid Films 222 (1-2), pp. 269-273.

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Abstract

We present a micro-Raman study of short-period [001] Si/Ge superlattices. The submicron spatial resolution of this technique enables in-plane scattering geometries, thus overcoming the severe limitations of conventional Raman set-ups for backscattering from the growth surface, where only longitudinal modes can be observed. We were able to study the complete phonon spectrum consisting of confined ...

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Item Type:Article
Date:16 December 1992
Institutions:Physics > Institute of Experimental and Applied Physics > Retired Professors > Group Werner Wegscheider
Identification Number:
ValueType
10.1016/0040-6090(92)90083-NDOI
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Martin Kaiser
Deposited On:26 Oct 2009 14:07
Last Modified:13 Mar 2014 11:19
Item ID:10009
Owner Only: item control page

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