Schorer, R. and Wegscheider, Werner and Eberl, Karl and Kasper, E. and Kibbel, H. and Abstreiter, Gerhard (1992) In-plane Raman scattering of -grown Si/Ge superlattices. Thin Solid Films 222 (1-2), pp. 269-273.
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We present a micro-Raman study of short-period  Si/Ge superlattices. The submicron spatial resolution of this technique enables in-plane scattering geometries, thus overcoming the severe limitations of conventional Raman set-ups for backscattering from the growth surface, where only longitudinal modes can be observed. We were able to study the complete phonon spectrum consisting of confined ...
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|Date:||16 December 1992|
|Institutions:||Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider|
|Dewey Decimal Classification:||500 Science > 530 Physics|
|Created at the University of Regensburg:||Unknown|
|Deposited On:||26 Oct 2009 14:07|
|Last Modified:||13 Mar 2014 11:19|