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Influence of short-range ordering on roughness of (AlGa)As interfaces studied with cross-sectional scanning tunneling microscopy

Reusch, T. C. G. and Wenderoth, M. and Heinrich, A. J. and Engel, K. J. and Quaas, N. and Sauthoff, K. and Ulbrich, R. G. and Weber, E. R. and Uchida, K. and Wegscheider, Werner (2000) Influence of short-range ordering on roughness of (AlGa)As interfaces studied with cross-sectional scanning tunneling microscopy. Applied Physics Letters 76 (28), pp. 3882-3883.

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Abstract

Cross-sectional scanning tunneling microscopy was used to identify individual Al atoms on cleaved surfaces of two sets of (AlGa)As heterostructure samples grown with metalorganic vapor-phase epitaxy and molecular-beam epitaxy. We determined the average Al concentration profile perpendicular to the GaAs–(AlGa)As interfaces. Based on former investigations of short-range ordering in (AlGa)As bulk ...

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Item Type:Article
Date:26 June 2000
Institutions:Physics > Institute of Experimental and Applied Physics > Retired Professors > Group Werner Wegscheider
Research groups and research centres:Not selected
Identification Number:
ValueType
10.1063/1.126808DOI
Related URLs:
URLURL Type
http://link.aip.org/link/?APPLAB/76/3882/1Publisher
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Martin Kaiser
Deposited On:30 Nov 2009 13:28
Last Modified:13 Mar 2014 12:10
Item ID:11051
Owner Only: item control page

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