Startseite UB

Scanning gate measurements on a quantum wire

Ihn, Thomas and Rychen, J. and Cilento, T. and Held, R. and Ensslin, Klaus and Wegscheider, Werner and Bichler, Max (2002) Scanning gate measurements on a quantum wire. Physica E Low-dimensional Systems and Nanostructures 12 (1-4), pp. 691-694.

[img]PDF
Download (109kB) - Repository staff only

at publisher (via DOI)


Abstract

We have performed measurements on a semiconductor quantum wire in which we induce a local potential perturbation with the metallic tip of a scanning force microscope. Measurement of the sample resistance as a function of tip position results in an electrical map of the wire in real space. We find the fingerprint of potential fluctuations in the wire which appear as local resistance fluctuations ...

plus


Export bibliographical data



Item Type:Article
Date:January 2002
Institutions:Physics > Institute of Experimental and Applied Physics > Retired Professors > Group Werner Wegscheider
Identification Number:
ValueType
10.1016/S1386-9477(01)00379-4DOI
Classification:
NotationType
73.40.GkPACS
Keywords:Scanning probe techniques; Quantum wires; Phase coherence effects
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Martin Kaiser
Deposited On:07 Dec 2009 13:09
Last Modified:13 Mar 2014 12:15
Item ID:11306
Owner Only: item control page

Downloads

Downloads per month over past year

  1. University

University Library

Publication Server

Contact person
Gernot Deinzer

Telefon 0941 943-2759
Contact