Ihn, Thomas and Rychen, J. and Cilento, T. and Held, R. and Ensslin, Klaus and Wegscheider, Werner and Bichler, Max (2002) Scanning gate measurements on a quantum wire. Physica E Low-dimensional Systems and Nanostructures 12 (1-4), pp. 691-694.
Download (109kB) - Repository staff only
We have performed measurements on a semiconductor quantum wire in which we induce a local potential perturbation with the metallic tip of a scanning force microscope. Measurement of the sample resistance as a function of tip position results in an electrical map of the wire in real space. We find the fingerprint of potential fluctuations in the wire which appear as local resistance fluctuations ...
Export bibliographical data
|Institutions:||Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider|
|Keywords:||Scanning probe techniques; Quantum wires; Phase coherence effects|
|Dewey Decimal Classification:||500 Science > 530 Physics|
|Created at the University of Regensburg:||Unknown|
|Deposited On:||07 Dec 2009 13:09|
|Last Modified:||13 Mar 2014 12:15|