Ihn, Thomas and Rychen, J. and Cilento, T. and Held, R. and Ensslin, Klaus and Wegscheider, Werner and Bichler, Max
Scanning gate measurements on a quantum wire.
Physica E Low-dimensional Systems and Nanostructures 12 (1-4), pp. 691-694.
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We have performed measurements on a semiconductor quantum wire in which we induce a local potential perturbation with the metallic tip of a scanning force microscope. Measurement of the sample resistance as a function of tip position results in an electrical map of the wire in real space. We find the fingerprint of potential fluctuations in the wire which appear as local resistance fluctuations ...
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