Spatially highly resolved study of AFM scanning tip–quantum dot local interaction

Kičin, S. and Pioda, A and Ihn, Thomas and Sigrist, Martin and Fuhrer, A. and Ensslin, Klaus and Reinwald, Matthias and Wegscheider, Werner (2005) Spatially highly resolved study of AFM scanning tip–quantum dot local interaction. New Journal of Physics 7, p. 185.

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Abstract

Scanning-gate imaging of semiconductor quantum dots (QDs) promises access to probability distributions of quantum states. It could therefore be a novel tool for designing and optimizing tailored quantum states in such systems. A detailed study of a lithographically defined semiconductor QD in the Coulomb-blockade regime is presented, making use of the scanning-gate technique at a base temperature of 300 mK. The method allows a one-by-one manipulation of electrons in the structure. The obtained images interpreted with a suitable QD model guide the way to a local investigation of the electronic interior of the QD. Future perspectives of scanning-gate experiments on QDs are discussed.

Item Type:Article
Institutions: Physics > Institute of Experimental and Applied Physics > Retired Professors > Group Werner Wegscheider
Identification Number:
ValueType
10.1088/1367-2630/7/1/185DOI
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner:Universitätsbibliothek Regensburg
Deposited On:11 Jan 2010 14:39
Last Modified:21 Jul 2011 00:14
Item ID:11968
Owner Only: item control page