Scanning a metallic tip close to a quantum point contact

Pioda, A. and Brunner, D. and Kicin, S. and Ihn, Thomas and Sigrist, Martin and Fuhrer, A. and Ensslin, Klaus and Reinwald, Matthias and Wegscheider, Werner (2006) Scanning a metallic tip close to a quantum point contact. Physica E Low-dimensional Systems and Nanostructures 32 (1-2), pp. 167-170.

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Abstract

Low-temperature transport experiments on a quantum point contact under the influence of a scanning gate are reported. The scanning gate is the metallic tip of a scanning force microscope operating at a temperature of 300 mK. In particular, the influence of the scanning tip on conductance resonances observed in the gate-characteristics of the point contact is studied. The strongest conductance resonances appear to be related to the local potential within the channel of the point contact. As a consequence, the point contact with its conductance resonances can be used as a sensor for the local tip-induced potential.

Item Type:Article
Institutions: Physics > Institute of Experimental and Applied Physics > Retired Professors > Group Werner Wegscheider
Identification Number:
ValueType
10.1016/j.physe.2005.12.124DOI
Classification:
NotationType
07.20.Mc; 73.63.−bPACS
Keywords:Scanning probe microscopy; Scanning-gate microscopy; Quantum point contact
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner:Martin Kaiser
Deposited On:25 Jan 2010 14:14
Last Modified:21 Jul 2011 00:15
Item ID:12190
Owner Only: item control page