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Scanning a metallic tip close to a quantum point contact

Pioda, A. and Brunner, D. and Kicin, S. and Ihn, Thomas and Sigrist, Martin and Fuhrer, A. and Ensslin, Klaus and Reinwald, Matthias and Wegscheider, Werner (2006) Scanning a metallic tip close to a quantum point contact. Physica E Low-dimensional Systems and Nanostructures 32 (1-2), pp. 167-170.

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Low-temperature transport experiments on a quantum point contact under the influence of a scanning gate are reported. The scanning gate is the metallic tip of a scanning force microscope operating at a temperature of 300 mK. In particular, the influence of the scanning tip on conductance resonances observed in the gate-characteristics of the point contact is studied. The strongest conductance ...


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Item Type:Article
Date:May 2006
Institutions:Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider
Identification Number:
07.20.Mc; 73.63.−bPACS
Keywords:Scanning probe microscopy; Scanning-gate microscopy; Quantum point contact
Dewey Decimal Classification:500 Science > 530 Physics
Created at the University of Regensburg:Unknown
Deposited On:25 Jan 2010 13:14
Last Modified:13 Mar 2014 12:30
Item ID:12190
Owner Only: item control page


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