Fricke, C. and Hohls, F. and Wegscheider, Werner and Haug, Rolf J. (2008) Bimodal statistic on a single dot device. Physica E Low-dimensional Systems and Nanostructures 40 (5), pp. 1055-1058.
Download (251kB) - Repository staff only
We explore the full counting statistics of single electron tunneling through a quantum dot using a quantum point contact as non-invasive high bandwidth charge detector. The distribution of counted tunneling events is measured as a function of gate and source–drain-voltage for several consecutive electron numbers on the quantum dot. For bias voltages at which excited states become accessible we ...
Export bibliographical data
|Institutions:||Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider|
|Keywords:||Quantum dot; Full counting statistics; Shot noise; Correlation effects|
|Dewey Decimal Classification:||500 Science > 530 Physics|
|Created at the University of Regensburg:||Unknown|
|Deposited on:||01 Feb 2010 13:03|
|Last modified:||13 Mar 2014 12:44|