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Bimodal statistic on a single dot device

Fricke, C. and Hohls, F. and Wegscheider, Werner and Haug, Rolf J. (2008) Bimodal statistic on a single dot device. Physica E Low-dimensional Systems and Nanostructures 40 (5), pp. 1055-1058.

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Abstract

We explore the full counting statistics of single electron tunneling through a quantum dot using a quantum point contact as non-invasive high bandwidth charge detector. The distribution of counted tunneling events is measured as a function of gate and source–drain-voltage for several consecutive electron numbers on the quantum dot. For bias voltages at which excited states become accessible we ...

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Item Type:Article
Date:March 2008
Institutions:Physics > Institute of Experimental and Applied Physics > Retired Professors > Group Werner Wegscheider
Identification Number:
ValueType
10.1016/j.physe.2007.10.063DOI
Classification:
NotationType
72.70.+m; 73.23.Hk; 73.63.KvPACS
Keywords:Quantum dot; Full counting statistics; Shot noise; Correlation effects
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Martin Kaiser
Deposited On:01 Feb 2010 13:03
Last Modified:13 Mar 2014 12:44
Item ID:12633
Owner Only: item control page
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