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High-Resolution Imaging of Twin Intersections in Si/Ge Superlattices on Ge(001) Substrates

Wegscheider, Werner and Eberl, Karl and Abstreiter, Gerhard and Cerva, Hans and Oppolzer, H. (1991) High-Resolution Imaging of Twin Intersections in Si/Ge Superlattices on Ge(001) Substrates. In: Cullis, Anthony G., (ed.) Microscopy of semiconducting materials 1991. Conference series, 117. Institute of Physics, Bristol, p. 21. ISBN 0-85498-406-2.

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Item type:Book section
Date:1991
Institutions:Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Deposited on:08 Feb 2010 13:49
Last modified:08 Feb 2010 13:49
Item ID:12764
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