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Electronic Properties of Semiconductor Nanostructures patterned by AFM Lithography

Heinzel, Thomas and Lüscher, Silvia and Held, Ryan and Fuhrer, Andreas and Ensslin, Klaus and Wegscheider, Werner and Bichler, Max (2000) Electronic Properties of Semiconductor Nanostructures patterned by AFM Lithography. In: 11th International Winterschool on New Developments in Solid State Physics, 21.-25. Februar 2000, Mauterndorf, Österreich.

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Item Type:Conference or Workshop Item (UNSPECIFIED)
Date:2000
Institutions:Physics > Institute of Experimental and Applied Physics > Retired Professors > Group Werner Wegscheider
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Martin Kaiser
Deposited On:02 Mar 2010 12:56
Last Modified:02 Mar 2010 12:56
Item ID:13046
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