Go to content
UR Home

Electronic properties of AFM-defined semiconductor nanostructures

Lüscher, Silvia and Held, Ryan and Fuhrer, Andreas and Heinzel, Thomas and Ensslin, Klaus and Bichler, Max and Wegscheider, Werner (2001) Electronic properties of AFM-defined semiconductor nanostructures. Materials Science and Engineering C 15 (1-2), pp. 153-157.

Download (226kB) - Repository staff only

at publisher (via DOI)


The quest for even smaller and better-controlled semiconductor nanostructures calls for improved nanofabrication techniques. We succeeded in patterning metallic and semiconducting nanostructures by using local oxidation-mediated via a voltage between a conducting surface and a close-by tip of an atomic force microscope (AFM). In particular, we were able to control the electronic properties of ...


Export bibliographical data

Item Type:Article
Date:20 August 2001
Institutions:Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider
Identification Number:
Keywords:Semiconductor nanostructures; Nanofabrication
Dewey Decimal Classification:500 Science > 530 Physics
Created at the University of Regensburg:Unknown
Deposited On:02 Mar 2010 13:47
Last Modified:13 Mar 2014 13:01
Item ID:13198
Owner Only: item control page


Downloads per month over past year

  1. Homepage UR

University Library

Publication Server

Contact person
Gernot Deinzer

Phone +49 941 943-2759