Belmeguenai, M. and Zighem, F. and Roussigne, Y. and Cherif, S-M. and Moch, P. and Westerholt, K. and Woltersdorf, Georg and Bayreuther, Günther
Microstrip line ferromagnetic resonance and Brillouin light scattering investigations of magnetic properties of Co2MnGe Heusler thin films.
Physical Review B (PRB) 79 (2), 024419.
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Co2MnGe films of different thicknesses (34, 55, and 83 nm) were grown by rf sputtering at 400 degrees C on single-crystal Al2O3 corundum
substrates showing an in-plane c axis. Their dynamic magnetic
properties were studied using conventional and microstrip line (MS)
ferromagnetic resonances (FMRs), as well as Brillouin light scattering
(BLS) techniques. The effective ...
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