Belmeguenai, M. and Martin, T. and Woltersdorf, Georg and Bayreuther, Günther and Baltz, V. and Suszka, A. K. and Hickey, B. J.
Microwave spectroscopy with vector network analyzer for interlayer exchange-coupled symmetrical and asymmetrical NiFe/Ru/NiFe.
Journal of Physics: Condensed Matter 20 (34), p. 5206.
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Vector network analyzer ferromagnetic resonance spectroscopy (VNA-FMR) is used here to study the different excited modes of sputtered
asymmetrical NiFe(13.6 nm)/Ru(d(Ru))/NiFe(27.2 nm) exchange-coupled
films with variable Ru thicknesses. The obtained results have been
compared to those of the symmetrical NiFe( 30 nm)/Ru( dRu)/NiFe( 30
nm). In both cases, the measurements show ...
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