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Structural and magnetic properties of NiMnSb/InGaAs/InP(001)

Koveshnikov, A and Woltersdorf, Georg and Liu, JQ and Kardasz, B and Mosendz, O and Heinrich, B and Kavanagh, KL and Bach, P and Bader, AS and Schumacher, C and Ruster, C and Gould, C and Schmidt, G and Molenkamp, LW and Kumpf, C (2005) Structural and magnetic properties of NiMnSb/InGaAs/InP(001). Journal of Applied Physics 97 (7), 073906.

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Abstract

The structural and magnetic properties of NiMnSb films, 5-120 nm thick, grown on InGaAs/InP(001) substrates by molecular-beam epitaxy, were studied by x-ray diffraction, transmission electron microscopy (TEM), and ferromagnetic resonance (FMR) techniques. X-ray diffraction and TEM studies show that the NiMnSb films had the expected half-Heusler structure, and films up to 120 nm ...

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Item Type:Article
Date:April 2005
Institutions:UNSPECIFIED
Identification Number:
ValueType
10.1063/1.1873036DOI
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Owner: Georg Woltersdorf
Deposited On:27 May 2010 07:34
Last Modified:13 Mar 2014 13:26
Item ID:14941
Owner Only: item control page
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