Koveshnikov, A and Woltersdorf, Georg and Liu, JQ and Kardasz, B and Mosendz, O and Heinrich, B and Kavanagh, KL and Bach, P and Bader, AS and Schumacher, C and Ruster, C and Gould, C and Schmidt, G and Molenkamp, LW and Kumpf, C
Structural and magnetic properties of NiMnSb/InGaAs/InP(001).
Journal of Applied Physics 97 (7), 073906.
at publisher (via DOI)
The structural and magnetic properties of NiMnSb films, 5-120 nm thick, grown on InGaAs/InP(001) substrates by molecular-beam epitaxy, were
studied by x-ray diffraction, transmission electron microscopy (TEM),
and ferromagnetic resonance (FMR) techniques. X-ray diffraction and TEM
studies show that the NiMnSb films had the expected half-Heusler
structure, and films up to 120 nm ...
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|Dewey Decimal Classification:||500 Science > 530 Physics|
|Refereed:||Yes, this version has been refereed|
|Created at the University of Regensburg:||Unknown|
|Deposited on:||27 May 2010 07:34|
|Last modified:||13 Mar 2014 13:26|