Deutsch
Wurstbauer, Ulrich and Röling, Christian and Wurstbauer, Ursula and Wegscheider, Werner and Vaupel, Matthias and Thiesen, Peter H. and Weiss, Dieter (2010) Imaging ellipsometry of graphene. Applied Physics Letters 97, p. 231901.
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Other URL: http://link.aip.org/link/APPLAB/v97/i23/p231901/s1
Abstract
Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way, the influence of the substrate on graphene’s optical properties can be investigated.
| Item Type: | Article | ||||||
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| Institutions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss Physics > Institute of Experimental and Applied Physics > Retired Professors > Group Werner Wegscheider | ||||||
| Projects: | GRK 638 Nonlinearity and nonequilibrium in condensed matter, GRK 1570, Elektronische Eigenschaften von Nanostrukturen auf Kohlenstoff-Basis | ||||||
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| Classification: |
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| Keywords: | ellipsometry, graphene, optical constants, optical dispersion | ||||||
| Subjects: | 500 Science > 530 Physics | ||||||
| Status: | Published | ||||||
| Refereed: | Yes, this version has been refereed | ||||||
| Created at the University of Regensburg: | Yes | ||||||
| Owner: | Claudia Rahm | ||||||
| Deposited On: | 15 Dec 2010 13:35 | ||||||
| Last Modified: | 06 Sep 2012 13:34 | ||||||
| Item ID: | 18792 |
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