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Imaging ellipsometry of graphene

Wurstbauer, Ulrich and Röling, Christian and Wurstbauer, Ursula and Wegscheider, Werner and Vaupel, Matthias and Thiesen, Peter H. and Weiss, Dieter (2010) Imaging ellipsometry of graphene. Applied Physics Letters 97, p. 231901.

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Abstract

Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way, the influence ...

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Item Type:Article
Date:6 December 2010
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss
Physics > Institute of Experimental and Applied Physics > Retired Professors > Group Werner Wegscheider
Projects:GRK 638 Nonlinearity and nonequilibrium in condensed matter, GRK 1570, Elektronische Eigenschaften von Nanostrukturen auf Kohlenstoff-Basis
Identification Number:
ValueType
10.1063/1.3524226DOI
Classification:
NotationType
78.67.WjPACS
78.20.CiPACS
Keywords:ellipsometry, graphene, optical constants, optical dispersion
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Owner: Claudia Rahm
Deposited On:15 Dec 2010 12:35
Last Modified:13 Mar 2014 14:23
Item ID:18792
Owner Only: item control page
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