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Imaging ellipsometry of graphene

Wurstbauer, Ulrich and Röling, Christian and Wurstbauer, Ursula and Wegscheider, Werner and Vaupel, Matthias and Thiesen, Peter H. and Weiss, Dieter (2010) Imaging ellipsometry of graphene. Applied Physics Letters 97, p. 231901.

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Imaging ellipsometry studies of graphene on SiO2/Si and crystalline GaAs are presented. We demonstrate that imaging ellipsometry is a powerful tool to detect and characterize graphene on any flat substrate. Variable angle spectroscopic ellipsometry is used to explore the dispersion of the optical constants of graphene in the visible range with high lateral resolution. In this way, the influence of the substrate on graphene’s optical properties can be investigated.

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Item type:Article
Date:6 December 2010
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss
Physics > Institute of Experimental and Applied Physics > Alumni or Retired Professors > Group Werner Wegscheider
Projects:GRK 638 Nonlinearity and nonequilibrium in condensed matter, GRK 1570, Elektronische Eigenschaften von Nanostrukturen auf Kohlenstoff-Basis
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Keywords:ellipsometry, graphene, optical constants, optical dispersion
Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Deposited on:15 Dec 2010 12:35
Last modified:13 Mar 2014 14:23
Item ID:18792
Owner only: item control page


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