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Magnetization profile at the Fe/GaAs(001)-4x6 interface

Giovanelli, Luca and Tian, C. and Gastelois, P. and Panaccione, G. and Fabrizioli, M. and Hochstrasser, M. and Galaktionov, M. and Back, Christian and Rossi, G. (2004) Magnetization profile at the Fe/GaAs(001)-4x6 interface. Physica B Condensed Matter 345 (1-4), pp. 177-180.

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Abstract

The magnetization of a thin Fe film epitaxially grown on GaAs(0 0 1)-4×6 was studied at different depths from the metal/semiconductor interface using a single layer of Fe0.5Co0.5 as a marker layer through a double-wedge Fe film. By measuring the X-ray magnetic circular dichroism spectroscopy at the L2,3 of Co, the magnetic response of the film could be sensed at different distances from the ...

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Item Type:Article
Date:March 2004
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Christian Back
Identification Number:
ValueType
10.1016/j.physb.2003.11.048DOI
Keywords:Fe; Co; GaAs; X-ray magnetic circular dichroism; Spin injection
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Owner: Webmaster Back
Deposited On:20 Mar 2007
Last Modified:13 Mar 2014 10:09
Item ID:1915
Owner Only: item control page
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