Giovanelli, Luca and Tian, C. and Gastelois, P. and Panaccione, G. and Fabrizioli, M. and Hochstrasser, M. and Galaktionov, M. and Back, Christian and Rossi, G. (2004) Magnetization profile at the Fe/GaAs(001)-4x6 interface. Physica B Condensed Matter 345 (1-4), pp. 177-180.
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The magnetization of a thin Fe film epitaxially grown on GaAs(0 0 1)-4×6 was studied at different depths from the metal/semiconductor interface using a single layer of Fe0.5Co0.5 as a marker layer through a double-wedge Fe film. By measuring the X-ray magnetic circular dichroism spectroscopy at the L2,3 of Co, the magnetic response of the film could be sensed at different distances from the interface. Data show a reduction of the magnetization at the interface though the existence of a magnetically “dead” layer is completely ruled out. Moreover, the magnetization was found to be reduced at the Fe film surface.
|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Christian Back|
|Keywords:||Fe; Co; GaAs; X-ray magnetic circular dichroism; Spin injection|
|Subjects:||500 Science > 530 Physics|
|Refereed:||Yes, this version has been refereed|
|Created at the University of Regensburg:||Yes|
|Deposited On:||20 Mar 2007|
|Last Modified:||20 Jul 2011 21:04|