Deutsch
Böcker, M. and Anczykowski, B. and Wegener, Joachim and Schäffer, T. (2007) Scanning Ion Conductance Microscopy with distance-modulated shear force control. Nanotechnology 18, p. 145505.
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| Item Type: | Article |
|---|---|
| Institutions: | Chemistry and Pharmacy > Institut für Analytische Chemie, Chemo- und Biosensorik > Bioanalytik und Biosensorik (Prof. Joachim Wegener) |
| Subjects: | 500 Science > 540 Chemistry & allied sciences |
| Status: | Published |
| Refereed: | Yes, this version has been refereed |
| Created at the University of Regensburg: | No |
| Owner: | Nicole Guber |
| Deposited On: | 24 Mar 2011 08:26 |
| Last Modified: | 24 Mar 2011 08:26 |
| Item ID: | 20231 |
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