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Scanning Ion Conductance Microscopy with distance-modulated shear force control.

Böcker, M. and Anczykowski, B. and Wegener, Joachim and Schäffer, T. (2007) Scanning Ion Conductance Microscopy with distance-modulated shear force control. Nanotechnology 18, p. 145505.

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Item Type:Article
Date:2007
Institutions:Chemistry and Pharmacy > Institut für Analytische Chemie, Chemo- und Biosensorik > Bioanalytik und Biosensorik (Prof. Joachim Wegener)
Subjects:500 Science > 540 Chemistry & allied sciences
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:No
Owner: Nicole Guber
Deposited On:24 Mar 2011 07:26
Last Modified:24 Mar 2011 07:26
Item ID:20231
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