Wutscher, Elisabeth and Giessibl, Franz J.
Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes.
Review of Scientific Instruments 82 (9), 093703.
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Other URL: http://link.aip.org/link/?RSI/82/093703/1
We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor, a force sensor based on a quartz tuning fork with an all-electrical deflection measurement scheme. Small amplitudes, stiff sensors with bulk diamond tips and high Q values in air and liquid allow to obtain high resolution images. The noise sources in air and liquid are analyzed and compared for ...
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