Wutscher, Elisabeth and Giessibl, Franz J. (2011) Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes. Review of Scientific Instruments 82 (9), 093703.
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Other URL: http://link.aip.org/link/?RSI/82/093703/1
We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor, a force sensor based on a quartz tuning fork with an all-electrical deflection measurement scheme. Small amplitudes, stiff sensors with bulk diamond tips and high Q values in air and liquid allow to obtain high resolution images. The noise sources in air and liquid are analyzed and compared for ...
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|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl|
|Keywords:||atomic force microscopy; calcium compounds; diamond; force sensors; graphene; noise; Q-factor; quartz; vibrations|
|Dewey Decimal Classification:||500 Science > 530 Physics|
|Refereed:||Yes, this version has been refereed|
|Created at the University of Regensburg:||Yes|
|Deposited On:||12 Dec 2011 08:26|
|Last Modified:||13 Mar 2014 18:16|