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Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes

Wutscher, Elisabeth and Giessibl, Franz J. (2011) Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes. Review of Scientific Instruments 82 (9), 093703.

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Abstract

We report on atomic force microscopy (AFM) in ambient and liquid environments with the qPlus sensor, a force sensor based on a quartz tuning fork with an all-electrical deflection measurement scheme. Small amplitudes, stiff sensors with bulk diamond tips and high Q values in air and liquid allow to obtain high resolution images. The noise sources in air and liquid are analyzed and compared for ...

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Item Type:Article
Date:2011
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1063/1.3633950DOI
Classification:
NotationType
07.79.LhPACS
07.07.Df PACS
Keywords:atomic force microscopy; calcium compounds; diamond; force sensors; graphene; noise; Q-factor; quartz; vibrations
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Owner: Universitätsbibliothek Regensburg
Deposited On:12 Dec 2011 08:26
Last Modified:13 Mar 2014 18:16
Item ID:22922
Owner Only: item control page

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