Schneiderbauer, Maximilian and Wastl, Daniel S. and Giessibl, Franz J.
qPlus magnetic force microscopy in frequencymodulation mode with millihertz resolution.
Beilstein Journal of Nanotechnology 3, pp. 174-178.
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Other URL: http://www.beilstein-journals.org/bjnano/single/articleFullText.htm?vt=f&publicId=2190-4286-3-18&sn=9&bpn=singleSeries
Magnetic force microscopy (MFM) allows one to image the domain structure of ferromagnetic samples by probing the dipole forces between a magnetic probe tip and a magnetic sample. The magnetic domain structure of the sample depends on the alignment of the individual atomic magnetic moments. It is desirable to be able to image both individual atoms and domain structures with a single probe. ...
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