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Characterization of deep impurities in semiconductors by terahertz tunneling ionization

Ganichev, Sergey and Ziemann, E. and Yassievich, Irina and Perel, V. and Prettl, Wilhelm (2000) Characterization of deep impurities in semiconductors by terahertz tunneling ionization. In: European MRS - IUMRS - ICEM 2000: SYMPOSIUM M: Advanced Characterisation of Semiconductor Materials, 30. Mai – 2. Juni 2000, Strasbourg, France.

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Item Type:Conference or Workshop Item (Other)
Date:2000
Institutions:Physics > Institute of Experimental and Applied Physics > Professor Ganichev > Group Sergey Ganichev
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Owner: Christoph Drexler
Deposited On:05 Oct 2007
Last Modified:12 Aug 2009 03:01
Item ID:2428
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