Deutsch
Ganichev, Sergey and Ziemann, E. and Yassievich, Irina and Perel, V. and Prettl, Wilhelm (2000) Characterization of deep impurities in semiconductors by terahertz tunneling ionization. In: European MRS - IUMRS - ICEM 2000: SYMPOSIUM M: Advanced Characterisation of Semiconductor Materials, 30. Mai – 2. Juni 2000, Strasbourg, France.
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| Item Type: | Conference or Workshop Item (Other) |
|---|---|
| Institutions: | Physics > Institute of Experimental and Applied Physics > Professor Ganichev > Group Sergey Ganichev |
| Subjects: | 500 Science > 530 Physics |
| Status: | Published |
| Refereed: | Yes, this version has been refereed |
| Created at the University of Regensburg: | Yes |
| Owner: | Christoph Drexler |
| Deposited On: | 05 Oct 2007 |
| Last Modified: | 12 Aug 2009 05:01 |
| Item ID: | 2428 |
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