Startseite UB

Characterization of deep impurities in semiconductors by terahertz tunnel ionization

Ziemann, E. and Ganichev, Sergey and Yassievich, Irina and Prettl, Wilhelm (1998) Characterization of deep impurities in semiconductors by terahertz tunnel ionization. In: Defect and impurity engineered semiconductors II: MRS Spring Meeting, 13. - 17. April 1998, San-Francisco, California, USA.

Full text not available from this repository.


Export bibliographical data



Item Type:Conference or Workshop Item (UNSPECIFIED)
Date:1998
Institutions:Physics > Institute of Experimental and Applied Physics > Professor Ganichev > Group Sergey Ganichev
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Owner: Christoph Drexler
Deposited On:05 Oct 2007
Last Modified:17 Nov 2009 04:08
Item ID:2444
Owner Only: item control page
  1. University

University Library

Publication Server

Contact person
Gernot Deinzer

Telefon 0941 943-2759
Contact