Giessibl, Franz J. and Bielefeldt, Hartmut (2000) Physical interpretation of frequency-modulation atomic force microscopy. Physical Review B (PRB) 61 (15), pp. 9968-9971.
Frequency modulation atomic force microscopy is a method for imaging the surface of metals, semiconductors and insulators in ultrahigh vacuum with true atomic resolution. The imaging signal in this technique is the frequency shift Δf of an oscillating cantilever with eigenfrequency f0, spring constant k and amplitude A, which is subject to tip-sample forces Fts. Here, we present analytical ...
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|Date:||15 April 2000|
|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl|
|Dewey Decimal Classification:||500 Science > 530 Physics|
|Refereed:||Yes, this version has been refereed|
|Created at the University of Regensburg:||Unknown|
|Deposited on:||10 Jul 2012 13:48|
|Last modified:||20 May 2016 11:15|