Giessibl, Franz J.
Forces and frequency shifts in atomic-resolution dynamic-force microscopy.
Physical Review B (PRB) 56 (24), pp. 16010-16015.
at publisher (via DOI)
Other URL: http://link.aps.org/doi/10.1103/PhysRevB.56.16010
True atomic resolution in vacuum with a force microscope is now obtained routinely by using the frequency shift of an oscillating cantilever as the imaging signal. Here, a calculation is presented that relates the frequency shift to the forces between tip and sample for both large and small oscillation amplitudes. Also, the frequency versus distance data for van der Waals dominated tip-sample ...
Export bibliographical data