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Forces and frequency shifts in atomic-resolution dynamic-force microscopy

Giessibl, Franz J. (1997) Forces and frequency shifts in atomic-resolution dynamic-force microscopy. Physical Review B (PRB) 56 (24), pp. 16010-16015.

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Other URL: http://link.aps.org/doi/10.1103/PhysRevB.56.16010


Abstract

True atomic resolution in vacuum with a force microscope is now obtained routinely by using the frequency shift of an oscillating cantilever as the imaging signal. Here, a calculation is presented that relates the frequency shift to the forces between tip and sample for both large and small oscillation amplitudes. Also, the frequency versus distance data for van der Waals dominated tip-sample ...

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Item Type:Article
Date:1997
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1103/PhysRevB.56.16010DOI
Classification:
NotationType
UNSPECIFIED
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Petra Wild
Deposited On:05 Jul 2012 05:57
Last Modified:13 Mar 2014 18:59
Item ID:25272
Owner Only: item control page
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