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Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy

Tung, Raimond C. and Wutscher, Thorsten and Martinez-Martin, David and Reifenberger, Ronald G. and Giessibl, Franz J. and Raman, Arvind (2010) Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy. Journal of Applied Physics 107 (10), 104508-1-104508-8.

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Other URL: http://scitation.aip.org/content/aip/journal/jap/107/10/10.1063/1.3407511


Abstract

The time response of tuning-fork based sensors can be improved by operating them at higher eigenmodes because a measurement takes at least one oscillation cycle in dynamic force microscopy and the oscillation period of the second eigenmode is only about one sixth of the fundamental mode. Here we study the higher-order eigenmodes of quartz qPlus sensors [ Bettac et al., Nanotechnology 20, 264009 ...

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Item Type:Article
Date:24 May 2010
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1063/1.3407511DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Deposited On:10 Jul 2012 13:52
Last Modified:19 May 2016 13:58
Item ID:25278
Owner Only: item control page

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