Force Microscopy with Light-Atom Probes

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen (2004) Force Microscopy with Light-Atom Probes. Science 305 (5682), pp. 380-383.

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Abstract

The charge distribution in atoms with closed electron shells is spherically symmetric, whereas atoms with partially filled shells can form covalent bonds with pointed lobes of increased charge density. Covalent bonding in the bulk can also affect surface atoms, leading to four tiny humps spaced by less than 100 picometers in the charge density of adatoms on a (001) tungsten surface. We imaged these charge distributions by means of atomic force microscopy with the use of a light-atom probe (a graphite atom), which directly measured high-order force derivatives of its interaction with a tungsten tip. This process revealed features with a lateral distance of only 77 picometers.

Item Type:Article
Institutions: Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1126/science.1099730DOI
Keywords:
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner:Petra Wild
Deposited On:10 Jul 2012 15:55
Last Modified:10 Jul 2012 15:55
Item ID:25315
Owner Only: item control page