Deutsch
Giessibl, Franz J. and Quate, Calvin F. (2006) Exploring the Nanoworld with Atomic Force Microscopy. Physics today 59 (12), pp. 44-50.
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Abstract
Over its 20‐year history, the atomic force microscope has gradually evolved into an instrument whose spatial resolution is now fine enough to image subatomic features on the scale of picometers.
| Item Type: | Article | ||||
|---|---|---|---|---|---|
| Institutions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||
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| Subjects: | 500 Science > 530 Physics | ||||
| Status: | Published | ||||
| Refereed: | Unknown | ||||
| Created at the University of Regensburg: | Unknown | ||||
| Owner: | Petra Wild | ||||
| Deposited On: | 10 Jul 2012 16:00 | ||||
| Last Modified: | 10 Jul 2012 16:00 | ||||
| Item ID: | 25317 |
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