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Exploring the Nanoworld with Atomic Force Microscopy

Giessibl, Franz J. and Quate, Calvin F. (2006) Exploring the Nanoworld with Atomic Force Microscopy. Physics today 59 (12), pp. 44-50.

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Abstract

Over its 20‐year history, the atomic force microscope has gradually evolved into an instrument whose spatial resolution is now fine enough to image subatomic features on the scale of picometers.


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Item Type:Article
Date:December 2006
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1063/1.2435681DOI
Classification:
NotationType
68.37.PsPACS
07.79.-vPACS
34.20.-bPACS
Keywords:
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Partially
Deposited On:10 Jul 2012 14:00
Last Modified:17 May 2016 11:20
Item ID:25317
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