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Higher-harmonic atomic force microscopy

Giessibl, Franz J. (2006) Higher-harmonic atomic force microscopy. Surface and Interface Analysis 38 (12-13), pp. 1696-1701.

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Abstract

To maximize the spatial resolution of atomic force microscopy (AFM), it is helpful to isolate the spurious short-range components from the plethora of force contributions acting between AFM tips and samples. It is shown theoretically and experimentally that higher-harmonic AFM, a technique that utilizes the anharmonic deflection contributions that arise when a cantilever oscillates in the highly ...

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Item type:Article
Date:29 November 2006
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:BMBF 13N6918
Identification Number:
ValueType
10.1002/sia.2392DOI
Keywords:atomic force microscopy; sub–Angstrom spatial resolution; higher harmonics; qPlus sensor
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Deposited on:10 Jul 2012 14:04
Last modified:06 May 2016 09:14
Item ID:25319
Owner only: item control page
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