Giessibl, Franz J. (2006) Higher-harmonic atomic force microscopy. Surface and Interface Analysis 38 (12-13), pp. 1696-1701.
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To maximize the spatial resolution of atomic force microscopy (AFM), it is helpful to isolate the spurious short-range components from the plethora of force contributions acting between AFM tips and samples. It is shown theoretically and experimentally that higher-harmonic AFM, a technique that utilizes the anharmonic deflection contributions that arise when a cantilever oscillates in the highly nonlinear force field of a sample, is a suitable technique for maximizing spatial resolution. The qPlus sensor, a quartz cantilever that utilizes the piezoelectric effect for deflection detection, is particularly well suited for higher harmonic AFM because the physics of piezoelectric detection inherently magnifies the signal level of higher harmonics. Experimental results for W on graphite (0001), Si (111)-(7 × 7), NiO (100) and CaF2(111) are presented.
|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl|
|Subjects:||500 Science > 530 Physics|
|Created at the University of Regensburg:||Unknown|
|Deposited On:||10 Jul 2012 14:04|
|Last Modified:||10 Jul 2012 14:04|