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Higher-harmonic atomic force microscopy

Giessibl, Franz J. (2006) Higher-harmonic atomic force microscopy. Surface and Interface Analysis 38 (12-13), pp. 1696-1701.

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Abstract

To maximize the spatial resolution of atomic force microscopy (AFM), it is helpful to isolate the spurious short-range components from the plethora of force contributions acting between AFM tips and samples. It is shown theoretically and experimentally that higher-harmonic AFM, a technique that utilizes the anharmonic deflection contributions that arise when a cantilever oscillates in the highly ...

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Item Type:Article
Date:2006
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1002/sia.2392DOI
Keywords:
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Petra Wild
Deposited On:10 Jul 2012 14:04
Last Modified:10 Jul 2012 14:04
Item ID:25319
Owner Only: item control page
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