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AFM's path to atomic resolution

Giessibl, Franz J. (2005) AFM's path to atomic resolution. Materials Today 8 (5), pp. 32-41.

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We review progress in improving the spatial resolution of atomic force microscopy (AFM) under vacuum. After an introduction to the basic imaging principle and a conceptual comparison to scanning tunneling microscopy (STM), we outline the main challenges of AFM as well as the solutions that have evolved in the first 20 years of its existence. Some crucial steps along AFM's path toward higher resolution are discussed, followed by an outlook on current and future applications.

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Item type:Article
Date:May 2005
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:BMBF 13N6918
Identification Number:
Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Deposited on:10 Jul 2012 14:06
Last modified:13 May 2016 06:21
Item ID:25320
Owner only: item control page


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