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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-253231
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.25323
Zusammenfassung
In frequency modulation atomic force microscopy, the stiffness, quality factor and oscillation amplitude of the cantilever are important parameters. While the first atomic resolution results were obtained with amplitudes of a few hundred ångstrom, it has subsequently been shown that smaller amplitudes should result in a better signal-to-noise ratio and an increased sensitivity to the short-range ...
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