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A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy

Giessibl, Franz J. (2001) A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy. Applied Physics Letters 78 (1), pp. 123-125.

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Abstract

Frequency-modulation atomic force microscopy (FMAFM) has proven to be a powerful method for imaging surfaces with true atomic resolution. However, the tip–sample forces are not directly accessible by FMAFM. Here, an algorithm to recover the tip–sample forces from the frequency shift curve is introduced and demonstrated with experimental data. Also, an intuititive connection between frequency ...

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Item Type:Article
Date:2001
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1063/1.1335546DOI
Keywords:
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Petra Wild
Deposited On:10 Jul 2012 14:17
Last Modified:10 Jul 2012 14:17
Item ID:25325
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