| PDF (406kB) |
- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-253250
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.25325
Zusammenfassung
Frequency-modulation atomic force microscopy (FMAFM) has proven to be a powerful method for imaging surfaces with true atomic resolution. However, the tip–sample forces are not directly accessible by FMAFM. Here, an algorithm to recover the tip–sample forces from the frequency shift curve is introduced and demonstrated with experimental data. Also, an intuititive connection between frequency ...
Nur für Besitzer und Autoren: Kontrollseite des Eintrags
Downloadstatistik