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A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy

Giessibl, Franz J. (2001) A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy. Applied Physics Letters 78 (1), pp. 123-125.

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Other URL: http://scitation.aip.org/content/aip/journal/apl/78/1/10.1063/1.1335546


Abstract

Frequency-modulation atomic force microscopy (FMAFM) has proven to be a powerful method for imaging surfaces with true atomic resolution. However, the tip–sample forces are not directly accessible by FMAFM. Here, an algorithm to recover the tip–sample forces from the frequency shift curve is introduced and demonstrated with experimental data. Also, an intuititive connection between frequency ...

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Item Type:Article
Date:1 January 2001
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:BMBF 13N6918
Identification Number:
ValueType
10.1063/1.1335546DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Deposited On:10 Jul 2012 14:17
Last Modified:06 May 2016 10:48
Item ID:25325
Owner Only: item control page

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