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Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork

Giessibl, Franz J. (2000) Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork. Applied Physics Letters 76 (11), pp. 1470-1472.

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Abstract

Atomic resolution by noncontact atomic force microscopy with a self-sensing piezoelectric force sensor is presented. The sensor has a stiffness of 1800 N/m and is operated with sub-nanometer amplitudes, allowing atomic resolution with relatively bluntly etched tungsten tips. Sensitivity and noise are discussed.


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Item Type:Article
Date:13 March 2000
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:BMBF 13N6918
Identification Number:
ValueType
10.1063/1.126067DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Deposited On:10 Jul 2012 14:18
Last Modified:17 May 2016 14:03
Item ID:25326
Owner Only: item control page

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