Deutsch
Giessibl, Franz J. (2000) Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork. Applied Physics Letters 76 (11), pp. 1470-1472.
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Abstract
Atomic resolution by noncontact atomic force microscopy with a self-sensing piezoelectric force sensor is presented. The sensor has a stiffness of 1800 N/m and is operated with sub-nanometer amplitudes, allowing atomic resolution with relatively bluntly etched tungsten tips. Sensitivity and noise are discussed.
| Item Type: | Article | ||||
|---|---|---|---|---|---|
| Institutions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl | ||||
| Identification Number: |
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| Keywords: | |||||
| Subjects: | 500 Science > 530 Physics | ||||
| Status: | Published | ||||
| Refereed: | Unknown | ||||
| Created at the University of Regensburg: | Unknown | ||||
| Owner: | Petra Wild | ||||
| Deposited On: | 10 Jul 2012 16:18 | ||||
| Last Modified: | 10 Jul 2012 16:18 | ||||
| Item ID: | 25326 |
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