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High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork

Giessibl, Franz J. (1998) High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork. Applied Physics Letters 73 (26), pp. 3956-3958.

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Abstract

Force sensors are key elements of atomic force microscopes and surface profilometers. Sensors with an integrated deflection meter are particularly desirable. Here, quartz tuning forks as used in watches are utilized as force sensors. A novel technique is employed which simplifies the interpretation of the data and increases the imaging speed by at least one order of magnitude compared to previous ...

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Item Type:Article
Date:1998
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1063/1.122948DOI
Keywords:
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Petra Wild
Deposited On:10 Jul 2012 14:20
Last Modified:10 Jul 2012 14:20
Item ID:25327
Owner Only: item control page
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