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Principle of High-Resolution Atomic Force Microscopy

Giessibl, Franz J. (2003) B2. Principle of High-Resolution Atomic Force Microscopy. In: Blügel, Stefan and Luysberg, Martina and Urban, Knut and Waser, Rainer, (eds.) Fundamentals of nanoelectronics : lecture manuscripts of the 34th spring school of the Department of Solid State Research / Forschungszentrum Jülich GmbH, Institut für Festkörperforschung. Schriften des Forschungszentrums Jülich : Reihe Materie und Material, 14 (B2). Forschungszentrum, Zentralbibliothek, Jülich. ISBN 3-89336-319-X.

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Item type:Book section
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Dewey Decimal Classification:500 Science > 530 Physics
Created at the University of Regensburg:Unknown
Deposited on:10 Jul 2012 14:29
Last modified:06 May 2016 08:10
Item ID:25331
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