Go to content
UR Home

Imaging silicon by atomic force microscopy with crystallographically oriented tips

Giessibl, Franz J. and Hembacher, Stefan and Bielefeldt, Hartmut and Mannhart, Jochen (2001) Imaging silicon by atomic force microscopy with crystallographically oriented tips. Applied Physics A: Materials Science & Processing 72 (Suppl1), pp. 15-17.

[img]
Preview
PDF
Download (110kB)

at publisher (via DOI)


Abstract

The images obtained by atomic force microscopy (AFM) originate from a convolution of atomic tip and sample states. Since the vertical resolution of AFM is approaching the picometer level, the atomic and subatomic structure of the tip is becoming increasingly important. Here, we demonstrate the preparation of crystallographically oriented AFM tips by breaking a silicon wafer along its preferential ...

plus


Export bibliographical data



Item type:Article
Date:27 March 2001
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:BMBF 13N6918
Identification Number:
ValueType
10.1007/s003390100627DOI
Classification:
NotationType
07.79.LhPACS
34.20.CfPACS
68.37.EPACS
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Deposited on:10 Jul 2012 14:33
Last modified:07 Jun 2016 11:52
Item ID:25334
Owner only: item control page

Downloads

Downloads per month over past year

  1. Homepage UR

University Library

Publication Server

Contact person
Gernot Deinzer

Phone +49 941 943-2759
Contact