Giessibl, Franz J. and Hembacher, Stefan and Bielefeldt, Hartmut and Mannhart, Jochen
Imaging silicon by atomic force microscopy with crystallographically oriented tips (so in der ZS angegeben) Vom Verfasser so:
Imaging Silicon with Crystallographically Oriented Tips by Atomic Force Microscopy / Proceedings of NC-AFM 2000. Applied Physics A: Materials Science & Processing 72 (Suppl1), pp. 15-17.
The images obtained by atomic force microscopy (AFM) originate from a convolution of atomic tip and sample states. Since the vertical resolution of AFM is approaching the picometer level, the atomic and subatomic structure of the tip is becoming increasingly important. Here, we demonstrate the preparation of crystallographically oriented AFM tips by breaking a silicon wafer along its preferential ...
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|Date:||27 March 2001|
|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl|
|Dewey Decimal Classification:||500 Science > 530 Physics|
|Refereed:||Yes, this version has been refereed|
|Created at the University of Regensburg:||Unknown|
|Deposited On:||10 Jul 2012 14:33|
|Last Modified:||20 May 2016 09:40|