Deutsch
Giessibl, Franz J. (1999) Force Microscopy in Vacuum with Atomic Resolution. In: Kuk, Y. and Lyo, I.W. and Jeon, D. and Park, S. I., (eds.) Preliminary proceedings of STM : 10th Int'l Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy ; 19 - 23 July, 1999, Seoul, Korea. UNSPECIFIED, pp. 19-20.
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| Item Type: | Book Section |
|---|---|
| Institutions: | Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl |
| Keywords: | |
| Subjects: | 500 Science > 530 Physics |
| Status: | Published |
| Refereed: | Unknown |
| Created at the University of Regensburg: | Unknown |
| Owner: | Petra Wild |
| Deposited On: | 10 Jul 2012 16:34 |
| Last Modified: | 10 Jul 2012 16:34 |
| Item ID: | 25335 |
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