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Force Microscopy in Vacuum with Atomic Resolution

Giessibl, Franz J. (1999) Force Microscopy in Vacuum with Atomic Resolution. In: Kuk, Y. and Lyo, I.W. and Jeon, D. and Park, S. I., (eds.) Preliminary proceedings of STM : 10th Int'l Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy ; 19 - 23 July, 1999, Seoul, Korea. , pp. 19-20.

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Item Type:Book Section
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Dewey Decimal Classification:500 Science > 530 Physics
Created at the University of Regensburg:Unknown
Deposited On:10 Jul 2012 14:34
Last Modified:06 May 2016 08:12
Item ID:25335
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