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Advances in Atomic Force Microscopy

Giessibl, Franz J. (2003) Advances in Atomic Force Microscopy. Reviews of Modern Physics (RMP) 75 (3), pp. 949-983.

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Other URL: http://link.aps.org/doi/10.1103/RevModPhys.75.949


Abstract

This article reviews the progress of atomic force microscopy in ultrahigh vacuum, starting with its invention and covering most of the recent developments. Today, dynamic force microscopy allows us to image surfaces of conductors and insulators in vacuum with atomic resolution. The most widely used technique for atomic-resolution force microscopy in vacuum is frequency-modulation atomic force ...

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Item type:Article
Date:29 September 2003
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Projects:BMBF 13N6918
Identification Number:
ValueType
10.1103/RevModPhys.75.949DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Deposited on:13 Jul 2012 08:15
Last modified:12 May 2016 12:46
Item ID:25336
Owner only: item control page

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