Giessibl, Franz J. (2003) Atomic Force Microscopy on Its Way to Adolescence. AIP Conference Proceedings 696 (1), pp. 60-67.
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When the atomic force microscope (AFM) was introduced in 1986, its potential to resolve surfaces with true atomic resolution was already proposed. However, substantial problems had to be overcome before atomic resolution became possible by AFM. Today, true atomic resolution by AFM is standard practice. This article discusses the influence of the cantilever stiffness and — amplitude on noise and ...
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|Date:||18 December 2003|
|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl|
|Dewey Decimal Classification:||500 Science > 530 Physics|
|Refereed:||Yes, this version has been refereed|
|Created at the University of Regensburg:||Unknown|
|Deposited On:||13 Jul 2012 08:16|
|Last Modified:||12 May 2016 12:39|