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Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations

Giessibl, Franz J. and Bielefeldt, Hartmut and Hembacher, Stefan and Mannhart, Jochen (2001) Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations. Annalen der Physik 10 (11-12), pp. 887-910.

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Abstract

Atomic force microscopy (AFM) is a mechanical profiling technique that allows to image surfaces with atomic resolution. Recent progress in reducing the noise of this technique has led to a resolution level where previously undetectable symmetries of the images of single atoms are observed. These symmetries are related to the nature of the interatomic forces. The Si(111)-(7 × 7) surface is studied ...

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Item type:Article
Date:10 October 2001
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1002/1521-3889(200111)10:11/12<887::AID-ANDP887>3.0.CO;2-BDOI
Classification:
NotationType
68.37.PsPACS
34.20.CfPACS
68.35.GyPACS
68.35.JaPACS
Keywords:atomic force microscope; atomic orbitals
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Unknown
Deposited on:13 Jul 2012 08:03
Last modified:17 May 2016 13:20
Item ID:25341
Owner only: item control page

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