Giessibl, Franz J. and Bielefeldt, Hartmut and Hembacher, Stefan and Mannhart, Jochen (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Applied Surface Science 140 (3-4), pp. 352-357.
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True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency modulation atomic force microscopy. So far, the imaging parameters (i.e., eigenfrequency, stiffness and oscillation amplitude of the cantilever, frequency shift) which result in optimal spatial resolution for a given cantilever and sample have been found empirically. Here, we calculate the optimal set of parameters from first principles as a function of the tip–sample system. The result shows that the either the acquisition rate or the signal-to-noise ratio could be increased by up to two orders of magnitude by using stiffer cantilevers and smaller amplitudes than are in use today.
|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl|
|Keywords:||Atomic force microscopy; Frequency modulation atomic force microscopy; Dynamic force microscopy; Atomic resolution; Tip–sample interaction; Dissipation; Thermal noise|
|Subjects:||500 Science > 530 Physics|
|Created at the University of Regensburg:||Unknown|
|Deposited On:||13 Jul 2012 10:01|
|Last Modified:||13 Jul 2012 10:01|
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