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Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

Giessibl, Franz J. and Bielefeldt, Hartmut and Hembacher, Stefan and Mannhart, Jochen (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Applied Surface Science 140 (3-4), pp. 352-357.

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Abstract

True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency modulation atomic force microscopy. So far, the imaging parameters (i.e., eigenfrequency, stiffness and oscillation amplitude of the cantilever, frequency shift) which result in optimal spatial resolution for a given cantilever and sample have been found empirically. Here, we calculate the optimal ...

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Item Type:Article
Date:1999
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1016/S0169-4332(98)00553-4DOI
Keywords:Atomic force microscopy; Frequency modulation atomic force microscopy; Dynamic force microscopy; Atomic resolution; Tip–sample interaction; Dissipation; Thermal noise
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Petra Wild
Deposited On:13 Jul 2012 08:01
Last Modified:13 Jul 2012 08:01
Item ID:25342
Owner Only: item control page
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