Bielefeldt, Hartmut and Giessibl, Franz J. (1999) A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics. Surface Science 440 (3), L863-L867.
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The forces acting on the substrate in intermittent-contact-mode (IC mode, tapping mode) atomic force microscopy are not accessible to a direct measurement. For an estimation of these forces, a simple analytical model is developed by considering only the shift of the cantilever resonance frequency caused by Hertzian (contact) forces. Based on the relationship between frequency shift and tip–sample force for large-amplitude frequency-modulation atomic force microscopy, amplitude and phase versus distance curves are calculated for the intermittent contact mode, and the forces on the substrate are calculated. The results show a qualitative agreement with numerical calculations, yielding typical maximal forces of 50–150 nN. When working above the unperturbed resonance, forces are found to be significantly larger than below the resonance.
|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl|
|Keywords:||Atomic force microscopy; Intermittent contact; Tapping mode|
|Subjects:||500 Science > 530 Physics|
|Created at the University of Regensburg:||Unknown|
|Deposited On:||13 Jul 2012 09:59|
|Last Modified:||13 Jul 2012 09:59|
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