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A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics

Bielefeldt, Hartmut and Giessibl, Franz J. (1999) A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics. Surface Science 440 (3), L863-L867.

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Abstract

The forces acting on the substrate in intermittent-contact-mode (IC mode, tapping mode) atomic force microscopy are not accessible to a direct measurement. For an estimation of these forces, a simple analytical model is developed by considering only the shift of the cantilever resonance frequency caused by Hertzian (contact) forces. Based on the relationship between frequency shift and tip–sample ...

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Item Type:Article
Date:1999
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Giessibl > Group Franz J. Giessibl
Identification Number:
ValueType
10.1016/S0039-6028(99)00861-4DOI
Keywords:Atomic force microscopy; Intermittent contact; Tapping mode
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Unknown
Created at the University of Regensburg:Unknown
Owner: Petra Wild
Deposited On:13 Jul 2012 07:59
Last Modified:13 Jul 2012 07:59
Item ID:25344
Owner Only: item control page
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