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In situ measurements of magnetoresistive effects in ferromagnetic microstructures by Lorentz microscopy

Haug, Thomas and Vogl, Anton and Zweck, Josef and Back, Christian (2006) In situ measurements of magnetoresistive effects in ferromagnetic microstructures by Lorentz microscopy. Applied Physics Letters 88, 082506.

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Other URL: http://dx.doi.org/10.1063/1.2179367


Abstract

We report on a four point resistance measurement inside a transmission electron microscope and during the imaging process which uses a special developed specimen holder. Lorentz microscopy allows us to observe the micromagnetic configuration of the ferromagnetic samples. Two different imaging techniques, Fresnel imaging and differential phase contrast, are used. The latter one allows lateral ...

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Item Type:Article
Date:2006
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Christian Back
Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Josef Zweck
Identification Number:
ValueType
10.1063/1.2179367DOI
Dewey Decimal Classification:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Deposited On:15 Nov 2007
Last Modified:26 Oct 2011 07:14
Item ID:2551
Owner Only: item control page
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