Haug, Thomas and Vogl, Anton and Zweck, Josef and Back, Christian (2006) In situ measurements of magnetoresistive effects in ferromagnetic microstructures by Lorentz microscopy. Applied Physics Letters 88, 082506.
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Other URL: http://dx.doi.org/10.1063/1.2179367
We report on a four point resistance measurement inside a transmission electron microscope and during the imaging process which uses a special developed specimen holder. Lorentz microscopy allows us to observe the micromagnetic configuration of the ferromagnetic samples. Two different imaging techniques, Fresnel imaging and differential phase contrast, are used. The latter one allows lateral ...
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|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Christian Back|
Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Josef Zweck
|Dewey Decimal Classification:||500 Science > 530 Physics|
|Refereed:||Yes, this version has been refereed|
|Created at the University of Regensburg:||Yes|
|Deposited on:||15 Nov 2007|
|Last modified:||26 Oct 2011 07:14|