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Interface magnetization profiling by x-ray magnetometry of marker impurities on Fe/GaAs(001)-(4x6)

Giovanelli, L. and Panaccione, G. and Rossi, G. and Fabrizioli, M. and Tian, C. and Gastelois, P. and Fujii, J. and Back, Christian (2005) Interface magnetization profiling by x-ray magnetometry of marker impurities on Fe/GaAs(001)-(4x6). Applied Physics Letters 87, 042506.

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Item Type:Article
Date:2005
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Back > Group Christian Back
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Owner: Webmaster Back
Deposited On:15 Nov 2007
Last Modified:14 Jul 2010 08:26
Item ID:2552
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