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Microscopic mapping of strain relaxation in uncoalesced pendeoepitaxial GaN on SiC

Schwarz, Uli and Schuck, P. and Mason, M. and Grober, R. and Roskowsky, A. and Einfeldt, S. and Davis, R. (2003) Microscopic mapping of strain relaxation in uncoalesced pendeoepitaxial GaN on SiC. Physical Review B 67, p. 45321.

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Item Type:Article
Date:2003
Institutions:Physics > Institute of Experimental and Applied Physics > Retired Professors > Group Ulrich Schwarz
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Owner: Redakteur Physik
Deposited On:15 Nov 2007
Last Modified:05 Aug 2009 13:40
Item ID:2607
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