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Raman spectroscopy of the interlayer shear mode in few-layer MoS2 flakes

Plechinger, Gerd and Heydrich, Stefanie and Eroms, Jonathan and Weiss, Dieter and Schüller, Christian and Korn, Tobias (2012) Raman spectroscopy of the interlayer shear mode in few-layer MoS2 flakes. AIP | Applied Physics Letters.

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Abstract

Single- and few-layer MoS2 has recently gained attention as an interesting material system for opto-electronics. Here, we report on scanning Raman measurements on few-layer MoS2 flakes prepared by exfoliation. We observe a Raman mode corresponding to a rigid shearing oscillation of adjacent layers. This mode appears at very low Raman shifts between 20 and 30 cm−1. Its position strongly depends on ...

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Item Type:Article
Date:5 September 2012
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Lupton > Group Christian Schüller
Identification Number:
ValueType
10.1063/1.4751266 UNSPECIFIED
Subjects:500 Science > 530 Physics
Status:Published
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Owner: Martin Schnabl
Deposited On:23 Oct 2012 06:37
Last Modified:13 Mar 2014 19:17
Item ID:26458
Owner Only: item control page

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