Plechinger, Gerd and Heydrich, Stefanie and Eroms, Jonathan and Weiss, Dieter and Schüller, Christian and Korn, Tobias (2012) Raman spectroscopy of the interlayer shear mode in few-layer MoS2 flakes. AIP | Applied Physics Letters.
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Single- and few-layer MoS2 has recently gained attention as an interesting material system for opto-electronics. Here, we report on scanning Raman measurements on few-layer MoS2 flakes prepared by exfoliation. We observe a Raman mode corresponding to a rigid shearing oscillation of adjacent layers. This mode appears at very low Raman shifts between 20 and 30 cm−1. Its position strongly depends on ...
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|Date:||5 September 2012|
|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Lupton > Group Christian Schüller|
|Subjects:||500 Science > 530 Physics|
|Refereed:||Yes, this version has been refereed|
|Created at the University of Regensburg:||Yes|
|Deposited On:||23 Oct 2012 06:37|
|Last Modified:||13 Mar 2014 19:17|