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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-295739
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.29573
Zusammenfassung
The spatial resolution of atomic force microscopy (AFM) can be drastically increased by terminating the tip with a single CO molecule. However, the CO molecule is not stiff, and lateral forces, such as those around the sides of molecules, distort images. This issue begs a larger question of how AFM can probe structures that are laterally weak. Lateral force microscopy (LFM) can probe lateral ...
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