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- URN zum Zitieren dieses Dokuments:
- urn:nbn:de:bvb:355-epub-338062
- DOI zum Zitieren dieses Dokuments:
- 10.5283/epub.33806
Alternative Links zum Volltext:DOI
Zusammenfassung
Kelvin probe force microscopy (KPFM) is a powerful technique to probe the local electronic structure of materials with atomic force microscopy. One assumption often made is that the applied bias drops fully in the tip-sample junction. We have recently identified an effect, the Phantom force, which can be explained by an ohmic voltage drop near the tip-sample junction causing a reduction of the ...
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