Kreuzer, S and Prügl, K and Bayreuther, Günther and Weiss, Dieter (1998) Epitaxial growth and patterning of sputtered Fe films on GaAs(001). Thin Solid Films 318, p. 219.
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Fe(001) films, 10100 nm thick, were epitaxially grown by magnetron sputtering on GaAs(001) and on 100-nm-thick Au(001) buffer layers in an UHV-based sputtering system. Excellent epitaxy is inferred from X-ray diffraction measurements and the magnetic anisotropy of the films. From X-ray ö-scans, the epitaxial relationships FeGaAs and FeAu were determined. Magnetic measurements by vibrating sample (VSM) and alternating gradient magnetometry (AGM) show a distinct fourfold in-plane anisotropy with the anisotropy constant of bulk Fe. Large- area patterning of the films was done by holographic lithography and ion beam etching. Square arrays of dots with periods of 300 nm to 1 ìm, dot widths of 50 to 490 nm and different heights were made. Magnetization measurements (VSM, AGM) show a clear change in the magnetic properties of the films dominated by the shape anisotropy of the dots. Again, for some of the samples a fourfold in-plane anisotropy can be observed.
|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss|
|Subjects:||500 Science > 530 Physics|
|Refereed:||Yes, this version has been refereed|
|Created at the University of Regensburg:||Yes|
|Deposited On:||25 May 2009 15:20|
|Last Modified:||05 Aug 2009 15:57|
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