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Scanning Hall Probe Microscopy with Shear Force Distance Control

Schweinböck, T and Weiss, Dieter and Lipinski, M and Eberl, K (2000) Scanning Hall Probe Microscopy with Shear Force Distance Control. Journal of Applied Physics 87, p. 6496.

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We describe a new type of scanning Hall probe microscope operating at room temperature for quantitative and noninvasive measurements of magnetic stray fields. The probe-sample distance is controlled by piezoelectrical detection of the shear forces acting on an oscillating cantilever. The Hall probes are manufactured from prepatterned GaAs wafers overgrown with a GaAs/AlGaAs ...


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Item Type:Article
Institutions:Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss
Dewey Decimal Classification:500 Science > 530 Physics
Refereed:Yes, this version has been refereed
Created at the University of Regensburg:Yes
Deposited On:25 May 2009 13:20
Last Modified:05 Aug 2009 13:57
Item ID:7909
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