Schweinböck, T and Weiss, Dieter and Lipinski, M and Eberl, K (2000) Scanning Hall Probe Microscopy with Shear Force Distance Control. Journal of Applied Physics 87, p. 6496.
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We describe a new type of scanning Hall probe microscope operating at room temperature for quantitative and noninvasive measurements of magnetic stray fields. The probe-sample distance is controlled by piezoelectrical detection of the shear forces acting on an oscillating cantilever. The Hall probes are manufactured from prepatterned GaAs wafers overgrown with a GaAs/AlGaAs ...
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|Institutions:||Physics > Institute of Experimental and Applied Physics > Chair Professor Weiss > Group Dieter Weiss|
|Dewey Decimal Classification:||500 Science > 530 Physics|
|Refereed:||Yes, this version has been refereed|
|Created at the University of Regensburg:||Yes|
|Deposited on:||25 May 2009 13:20|
|Last modified:||05 Aug 2009 13:57|