Schmidt, U. and Humlícek, J. and Lukes, F. and Cardona, M. and Presting, H. and Kibbel, H. and Kasper, E. and Eberl, Karl and Wegscheider, Werner and Abstreiter, Gerhard
Optical transitions in strained Ge/Si superlattices.
Physical Review B 45 (12), pp. 6793-6801.
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Spectroscopic ellipsometry has been used to determine the dielectric functions of ultrathin Ge/Si superlattices with varying strain states and periodicity at room temperature. The E1-like transitions could be resolved with the multiple-angle-of-incidence technique and in a thick, Ge-rich sample; they split up into various contributions and start to absorb the light at lower energies than ...
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