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Baker, W. J. and Ambal, K. and Waters, D. P. and Baarda, R. and Morishita, H. and van Schooten, K. and McCamey, D. R. and Lupton, J. M. and Boehme, C. (2012) Robust absolute magnetometry with organic thin-film devices. Nature Communications 3, p. 898.
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