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Article

Giessibl, Franz J. and Bielefeldt, Hartmut and Hembacher, Stefan and Mannhart, Jochen (2001) Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations. Annalen der Physik 10 (11-12), pp. 887-910. Fulltext not available.

Giessibl, Franz J. and Hembacher, Stefan and Bielefeldt, Hartmut and Mannhart, Jochen (2001) Imaging silicon by atomic force microscopy with crystallographically oriented tips (so in der ZS angegeben) Vom Verfasser so:
Imaging Silicon with Crystallographically Oriented Tips by Atomic Force Microscopy / Proceedings of NC-AFM 2000.
Applied Physics A: Materials Science & Processing 72 (Suppl1), pp. 15-17. Fulltext not available.

Giessibl, Franz J. and Bielefeldt, Hartmut (2000) Physical interpretation of frequency-modulation atomic force microscopy. Physical Review B (PRB) 61 (15), pp. 9968-9971.
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Giessibl, Franz J. and Hembacher, Stefan and Bielefeldt, Hartmut and Mannhart, Jochen (2000) Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy. Science 289 (5478), pp. 422-425. Fulltext not available.

Bielefeldt, Hartmut and Giessibl, Franz J. (1999) A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics. Surface Science 440 (3), L863-L867. Fulltext not available.

Giessibl, Franz J. and Bielefeldt, Hartmut and Hembacher, Stefan and Mannhart, Jochen (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Applied Surface Science 140 (3-4), pp. 352-357. Fulltext not available.

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