Startseite UB

Browse by Person

Up a level
Export as [feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Item Type | No Grouping
Number of items: 63.

Neu, Mathias and Moll, Nikolaj and Gross, Leo and Meyer, Gerhard and Giessibl, Franz J. and Repp, Jascha (2014) Image correction for atomic force microscopy images with functionalized tips. Physical Review B 89 (20), p. 205407.

Schneiderbauer, Maximilian and Emmrich, Matthias and Weymouth, Alfred J. and Giessibl, Franz J. (2014) CO Tip Functionalization Inverts Atomic Force Microscopy
Contrast via Short-Range Electrostatic Forces.
Physical Review Letters (PRL) 112, pp. 166102-1.

Pielmeier, Florian and Meuer, Daniel and Schmid, Daniel R. and Strunk, Christoph and Giessibl, Franz J. (2014) Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures. Beilstein Journal of Nanotechnology (5), pp. 407-412.

Weymouth, Alfred J. and Hofmann, Thomas and Giessibl, Franz J. (2014) Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy. Science.

Hofmann, Thomas and Pielmeier, Florian and Giessibl, Franz J. (2014) Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy. Physical Review Letters (PRL) 112, 066101.

Back, Christian and Fabian, Jaroslav and Giessibl, Franz J. and Richter, Klaus and Weiss, Dieter (2014) Spin Spin Spin Around - Der Sonderforschungsbereich 689. Blick in die Wissenschaft (29), pp. 3-10.

Wastl, Daniel S. and Speck, Florian and Wutscher, Elisabeth and Ostler, Markus and Seyller, Thomas and Giessibl, Franz J. (2013) Observation of 4 nm Pitch Stripe Domains Formed by Exposing Graphene to Ambient Air. ACS Nano.

Weymouth, Alfred J. and Meuer, Daniel and Mutombo, Pingo and Wutscher, Thorsten and Ondracek, Martin and Jelinek, Pavel and Giessibl, Franz J. (2013) Atomic Structure Affects the Directional Dependence of Friction. Physical Review Letters 111 (12), p. 126103.

Pielmeier, Florian and Giessibl, Franz J. (2013) Spin Resolution and Evidence for Superexchange on NiO(001) Observed by Force Microscopy. Physical Review Letters (PRL) 110 (26), p. 266101.

Wastl, Daniel S. and Weymouth, Alfred J. and Giessibl, Franz J. (2013) Optimizing atomic resolution of force microscopy in ambient conditions. Physical Review B (PRB) 87 (24), p. 245415.

Welker, Joachim and Giessibl, Franz J. (2012) Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy. Science 336 (608), pp. 444-449.

Welker, Joachim and Illek, Esther and Giessibl, Franz J. (2012) Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy. Beilstein Journal of Nanotechnology 3, pp. 238-248.

Schneiderbauer, Maximilian and Wastl, Daniel S. and Giessibl, Franz J. (2012) qPlus magnetic force microscopy in frequencymodulation mode with millihertz resolution. Beilstein Journal of Nanotechnology 3, pp. 174-178.

Wutscher, Thorsten and Weymouth, Alfred J. and Giessibl, Franz J. (2012) Localization of the phantom force induced by the tunneling current. Physical Review B (PRB) 85 (19), p. 195426.

Ternes, Markus and González, César and Lutz, Christopher P. and Hapala, Prokop and Giessibl, Franz J. and Jelinek, Pavel and Heinrich, Andreas J. (2011) Interplay of Conductance, Force, and Structural Change in Metallic Point Contacts. Physical Review Letters (PRL) 106 (1), 016802-1.

Welker, Joachim and de Faria Elsner, Frederico and Giessibl, Franz J. (2011) Application of the equipartition theorem to the thermal excitation of quartz tuning forks. Applied Physics Letters 99 (8), 084102.

Wutscher, Elisabeth and Giessibl, Franz J. (2011) Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes. Review of Scientific Instruments 82 (9), 093703.

Giessibl, Franz J. and Pielmeier, Florian and Eguchi, Toyoaki and An, Toshu and Hasegawa, Yukio (2011) Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators. Physical Review B (PRB) 84 (12), p. 125409.

Wutscher, Thorsten and Giessibl, Franz J. (2011) Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy. Review of Scientific Instruments 82 (2), 026106.

Weymouth, Alfred J. and Wutscher, Thorsten and Welker, Joachim and Hofman, Thomas and Giessibl, Franz J. (2011) Phantom Force Induced by Tunneling Current: A Characterization on Si(111). Physical Review Letters (PRL) 106 (22), p. 226801.

Tung, Raimond C. and Wutscher, Thorsten and Martinez-Martin, David and Reifenberger, Ronald G. and Giessibl, Franz J. and Raman, Arvind (2010) Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy. Journal of Applied Physics 107 (10), p. 104508.

Hofmann, Thomas and Welker, Joachim and Giessibl, Franz J. (2010) Preparation of light-atom tips for scanning probe microscopy by explosive delamination. Journal of Vacuum Science & Technology B 28 (3), C4E28.

Gross, Leo and Mohn, Fabian and Liljeroth, Peter and Repp, Jascha and Giessibl, Franz J. and Meyer, Gerhard (2009) Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy. Science 324 (5933), pp. 1428-1431.

Giessibl, Franz J. (2009) Auf die Spitze getrieben. Physik Journal 8 (11), pp. 20-21.

Morita, Seizo and Giessibl, Franz J. and Wiesendanger, Roland, eds. (2009) Noncontact Atomic Force Microscopy. Band 2. Nanoscience and technology. Springer, Heidelberg, Berlin. ISBN 978-3-642-01494-9.

Schmid, Martin and Mannhart, Jochen and Giessibl, Franz J. (2008) Searching atomic spin contrast on nickel oxide (001) by force microscopy. Physical Review B (PRB) 77 (4), 045402.

Ternes, Markus and Lutz, Christopher P. and Hirjibehedin, Cyrus F. and Giessibl, Franz J. and Heinrich, Andreas J. (2008) The Force Needed to Move an Atom on a Surface. Science 319 (5866), pp. 1066-1069.

Ternes, Markus and Heinrich, Andreas J. and Giessibl, Franz J. (2008) Wie viel Kraft ist nötig, um ein Atom zu bewegen? Physik in unserer Zeit 39 (3), pp. 111-112.

Giessibl, Franz J. (2007) Ein atomarer Fingerabdruck. Physik Journal 6 (5), pp. 22-23.

Schmid, Martin and Renner, Andreas and Giessibl, Franz J. (2006) Device for in situ cleaving of hard crystals. Review of Scientific Instruments 77 (3), 036101.

Zotti, Linda A. and Hofer, Werner A. and Giessibl, Franz J. (2006) Electron scattering in scanning probe microscopy experiments. Chemical Physics Letters 420 (1-3), pp. 177-182.

Giessibl, Franz J. and Quate, Calvin F. (2006) Exploring the Nanoworld with Atomic Force Microscopy. Physics today 59 (12), pp. 44-50.

Giessibl, Franz J. (2006) Higher-harmonic atomic force microscopy. Surface and Interface Analysis 38 (12-13), pp. 1696-1701.

Giessibl, Franz J. (2005) AFM's path to atomic resolution. Materials Today 8 (5), pp. 32-41.

Giessibl, Franz J. and Reichling, Michael (2005) Investigating atomic details of the CaF₂(111) surface with a qPlus sensor. Nanotechnology 16 (3), pp. 118-124.

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen and Quate, Calvin F. (2005) Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite. Physical Review Letters (PRL) 94 (5), 056101.

Morita, Seizo and Giessibl, Franz J. and Sugawara, Yasuhiro and Hosoi, Hirotaka and Mukasa, Koichi and Sasahara, Akira and Onishi, Hiroshi (2005) 13. Noncontact Atomic Force Microscopy and its Related Topics. In: Bhushan, Bharat, (ed.) Nanotribology and Nanomechanics An Introduction. Springer, Berlin, pp. 385-411. ISBN 978-3-540-24267-3.

Herz, Markus and Schiller, Christian H. and Giessibl, Franz J. and Mannhart, Jochen (2005) Simultaneous current-, force-, and work-function measurement with atomic resolution. Applied Physics Letters 86 (15), p. 153101.

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen (2004) Force Microscopy with Light-Atom Probes. Science 305 (5682), pp. 380-383.

Giessibl, Franz J. (2004) Silicon and Its Vital Role in The Evolution of Scanning Probe Microscopy. In: Siffert, Paul and Krimmel, E. F., (eds.) Silicon : evolution and future of a technology. Springer, Berlin, pp. 191-204. ISBN 3-540-40546-1.

Giessibl, Franz J. and Hembacher, Stefan and Herz, Markus and Schiller, C. H. and Mannhart, Jochen (2004) Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor. Nanotechnology 15 (2), pp. 79-86.

Giessibl, Franz J. (2003) Advances in Atomic Force Microscopy. Reviews of Modern Physics (RMP) 75 (3), pp. 949-983.

Giessibl, Franz J. (2003) Atomic Force Microscopy on Its Way to Adolescence. AIP Conference Proceedings 696 (1), pp. 60-67.

Giessibl, Franz J. (2003) B2. Principle of High-Resolution Atomic Force Microscopy. In: Blügel, Stefan and Luysberg, Martina and Urban, Knut and Waser, Rainer, (eds.) Fundamentals of nanoelectronics : lecture manuscripts of the 34th spring school of the Department of Solid State Research / Forschungszentrum Jülich GmbH, Institut für Festkörperforschung. Schriften des Forschungszentrums Jülich : Reihe Materie und Material, 14 (B2). Forschungszentrum, Zentralbibliothek, Jülich. ISBN 3-89336-319-X.

Herz, Markus and Giessibl, Franz J. and Mannhart, F. (2003) Probing the shape of atoms in real space. Physical Review B (PRB) 68 (4), 045301.

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen and Quate, Calvin F. (2003) Revealing the hidden atom in graphite by low-temperature atomic force microscopy. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 100 (22), pp. 12539-12542.

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen (2002) Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum. Applied Surface Science 188 (3-4), pp. 445-449.

Giessibl, Franz J. and Herz, Markus and Mannhart, Jochen (2002) Friction traced to the single atom. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 99 (19), pp. 12006-12010.

Giessibl, Franz J. (2002) 2. Principle of NC-AFM. In: Morita, Seizo and Wiesendanger, Roland and Meyer, Ernst, (eds.) Noncontact atomic force microscopy. Band 1. Nanoscience and technology (2). Springer, Berlin, pp. 11-46. ISBN 3-540-43117-9 .

Giessibl, Franz J. (2002) Pushing the Resolution Limits of the Force Microscope: from Steps to Atoms and Atomic Orbitals. In: Proceedings of the Scanning Probe Microscopy-2002 (SPM-2002) Workshop : 3 March - 6 March 2002, Nizhny Novgorod, Russia. Physics of low-dimensional structures, 2002,5/6 . VSV, Moskau, pp. 172-174.

Giessibl, Franz J. (2001) A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy. Applied Physics Letters 78 (1), pp. 123-125.

Giessibl, Franz J. and Bielefeldt, Hartmut and Hembacher, Stefan and Mannhart, Jochen (2001) Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations. Annalen der Physik 10 (11-12), pp. 887-910.

Giessibl, Franz J. and Hembacher, Stefan and Bielefeldt, Hartmut and Mannhart, Jochen (2001) Imaging silicon by atomic force microscopy with crystallographically oriented tips (so in der ZS angegeben) Vom Verfasser so:
Imaging Silicon with Crystallographically Oriented Tips by Atomic Force Microscopy / Proceedings of NC-AFM 2000.
Applied Physics A: Materials Science & Processing 72 (Suppl1), pp. 15-17.

Giessibl, Franz J. (2001) Rasterkraftmikroskop sieht erstmals ins Innere des Atoms. Spektrum der Wissenschaft (April), pp. 12-14.

Giessibl, Franz J. (2000) Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork. Applied Physics Letters 76 (11), pp. 1470-1472.

Giessibl, Franz J. and Bielefeldt, Hartmut (2000) Physical interpretation of frequency-modulation atomic force microscopy. Physical Review B (PRB) 61 (15), pp. 9968-9971.

Giessibl, Franz J. and Hembacher, Stefan and Bielefeldt, Hartmut and Mannhart, Jochen (2000) Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy. Science 289 (5478), pp. 422-425.

Bielefeldt, Hartmut and Giessibl, Franz J. (1999) A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics. Surface Science 440 (3), L863-L867.

Giessibl, Franz J. and Bielefeldt, Hartmut and Hembacher, Stefan and Mannhart, Jochen (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Applied Surface Science 140 (3-4), pp. 352-357.

Giessibl, Franz J. (1999) Force Microscopy in Vacuum with Atomic Resolution. In: Kuk, Y. and Lyo, I.W. and Jeon, D. and Park, S. I., (eds.) Preliminary proceedings of STM : 10th Int'l Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy ; 19 - 23 July, 1999, Seoul, Korea. UNSPECIFIED, pp. 19-20.

Giessibl, Franz J. (1998) High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork. Applied Physics Letters 73 (26), pp. 3956-3958.

Giessibl, Franz J. (1997) Forces and frequency shifts in atomic-resolution dynamic-force microscopy. Physical Review B (PRB) 56 (24), pp. 16010-16015.

Giessibl, Franz J. and Tortonese, Marco (1997) Self-oscillating mode for frequency modulation noncontact atomic force microscopy. Applied Physics Letters 70 (19), pp. 2529-2531.

This list was generated on Mon Oct 20 15:10:30 2014 CEST.
  1. University

University Library

Publication Server

Contact person
Gernot Deinzer

Telefon 0941 943-2759
Contact