Go to content
UR Home

Publications by Giessibl, Franz J.

Up a level
Export as
[feed] Atom [feed] RSS 1.0 [feed] RSS 2.0
Group by: Date | Item type | No Grouping
Number of items: 89.

Okobayashi, Norio and Gustafsson, Alexander and Peronio, Angelo and Paulsson, Magnus and Arai, Toyoko and Giessibl, Franz J. (2016) Influence of atomic tip structure on the intensity of inelastic tunneling spectroscopy data analyzed by combined scanning tunneling spectroscopy, force microscopy, and density functional theory. Physical Review B (PRB) 93, pp. 165415-1.
[img]
Preview

Huber, Ferdinand and Matencio, Sonia and Weymouth, Alfred J. and Ocal, Carmen and Barrena, Esther and Giessibl, Franz J. (2015) Intramolecular Force Contrast and Dynamic Current-Distance Measurements at Room Temperature. Physical Review Letters 115 (6), 066101-1-066101-4.
[img]
Preview

Gross, Leo and Schuler, Bruno and Mohn, Fabian and Moll, Nikolaj and Repp, Jascha and Meyer, Gerhard (2015) 12. Atomic Resolution on Molecules with Functionalized Tips. In: Morita, Seizo and Giessibl, Franz J. and Meyer, Ernst and Wiesendanger, Roland, (eds.) Noncontact Atomic Force Microscopy: Volume 3. NanoScience and Technology (12). Springer International Publishing, pp. 223-246. ISBN 978-3-319-15587-6. Fulltext not available.

Emmrich, Matthias and Huber, Ferdinand and Pielmeier, Florian and Welker, Joachim and Hofmann, Thomas and Schneiderbauer, Maximilian and Meuer, Daniel and Polesya, Svitlana and Mankovsky, Sergiy and Koedderitzsch, Diemo and Ebert, Hubert and Giessibl, Franz J. (2015) Subatomic resolution force microscopy reveals internal structure and adsorption sites of small iron clusters. SCIENCE 348 (6232), pp. 308-311.
[img]
Preview

Emmrich, Matthias and Schneiderbauer, Maximilian and Huber, Ferdinand and Weymouth, Alfred J. and Okabayashi, Norio and Giessibl, Franz J. (2015) Force Field Analysis Suggests a Lowering of Diffusion Barriers in Atomic Manipulation Due to Presence of STM Tip. Physical Review Letters (PRL) 114, 146101-146101-5.
[img]
Preview

Wastl, Daniel S. and Judmann, Michael and Weymouth, Alfred J. and Giessibl, Franz J. (2015) Atomic Resolution of Calcium and Oxygen Sublattices of Calcite in Ambient Conditions by Atomic Force Microscopy Using qPlus Sensors with Sapphire Tips. ACS Nano 9 (4), pp. 3858-3865. Fulltext not available.

Wurster, Eva-Christina and Liebl, Renate and Michaelis, Stefanie and Robelek, Rudolf and Wastl, Daniel S. and Giessibl, Franz J. and Goepferich, Achim and Breunig, Miriam (2015) Oligolayer-Coated Nanoparticles: Impact of Surface Topography at the Nanobio Interface. ACS applied materials & interfaces 7, pp. 7891-7900. Fulltext not available.

Pielmeier, Florian and Landolt, Gabriel and Slomski, Bartosz and Muff, Stefan and Berwanger, Julian and Eich, Andreas and Khajetoorians, Alexander A. and Wiebe, Jens and Aliev, Ziya S. and Babanly, Mahammad B. and Wiesendanger, Roland and Osterwalder, Jürg and Chulkov, Evgueni V. and Giessibl, Franz J. and Dil, J . Hugo (2015) Response of the topological surface state to surface disorder in TIBiSe2. New Journal of Physics 17, 023067.
[img]
Preview

Ionescu, Andrei and Brambilla, Eugenio and Wastl, Daniel S. and Giessibl, Franz J. and Cazzaniga, Gloria and Schneider-Feyrer, Sibylle and Hahnel, Sebastian (2015) Influence of matrix and filler fraction on biofilm formation on the surface of experimental resin-based composites. Journal of Materials Science: Materials in Medicine 26, p. 58. Fulltext not available.

Morita, Seizo and Giessibl, Franz J. and Wiesendanger, Roland and Meyer, Ernst, eds. (2015) Noncontact Atomic Force Microscopy: Volume 3. NanoScience and Technology, (12). Springer. ISBN Hardcover 978-3-319-15587-6; eBook ISBN 978-3-319-15588-3. Fulltext not available.

Wurster, Eva-Christina and Liebl, Renate and Michaelis, Stefanie and Robelek, Rudolf and Wastl, Daniel S. and Giessibl, Franz J. and Göpferich, Achim and Breunig, Miriam (2015) Oligolayer-coated nanoparticles: impact of surface topography at the nanobio interface. ACS Applied Materials & Interfaces 7 (15), pp. 7891-7900. Fulltext not available.

Hahnel, Sebastian and Wastl, Daniel S. and Schneider-Feyrer, Sibylle and Giessibl, Franz J. and Brambilla, Eugenio and Cazzaniga, Gloria and Ionescu, Andrei (2014) Streptococcus mutans biofilm formation and release of fluoride from experimental resin-based composites depending on surface treatment and S-PRG filler particle fraction. The journal of adhesive dentistry (JAD) 16 (4), pp. 313-321. Fulltext not available.

Neu, Mathias and Moll, Nikolaj and Gross, Leo and Meyer, Gerhard and Giessibl, Franz J. and Repp, Jascha (2014) Image correction for atomic force microscopy images with functionalized tips. Physical Review B 89 (20), p. 205407.
[img]
Preview

Schneiderbauer, Maximilian and Emmrich, Matthias and Weymouth, Alfred J. and Giessibl, Franz J. (2014) CO Tip Functionalization Inverts Atomic Force Microscopy
Contrast via Short-Range Electrostatic Forces.
Physical Review Letters (PRL) 112, 166102-1-166102-5.
[img]
Preview

Wastl, Daniel S. and Weymouth, Alfred J. and Giessibl, Franz J. (2014) Atomically Resolved Graphitic Surfaces in Air by Atomic Force Microscopy. ACS NANO 8 (5), pp. 5233-5239. Fulltext not available.

Pielmeier, Florian and Meuer, Daniel and Schmid, Daniel R. and Strunk, Christoph and Giessibl, Franz J. (2014) Impact of thermal frequency drift on highest precision force microscopy using quartz-based force sensors at low temperatures. Beilstein Journal of Nanotechnology (5), pp. 407-412. Fulltext not available.

Hofmann, Thomas and Pielmeier, Florian and Giessibl, Franz J. (2014) Chemical and Crystallographic Characterization of the Tip Apex in Scanning Probe Microscopy. Physical Review Letters (PRL) 112 (6), 066101-1-066101-5. Fulltext restricted.
[img]

Weymouth, Alfred J. and Hofmann, Thomas and Giessibl, Franz J. (2014) Quantifying Molecular Stiffness and Interaction with Lateral Force Microscopy. Science 343 (6175), 1120-1-1120-5.
[img]
Preview

Back, Christian and Fabian, Jaroslav and Giessibl, Franz J. and Richter, Klaus and Weiss, Dieter (2014) Spin Spin Spin Around - Der Sonderforschungsbereich 689. Blick in die Wissenschaft (29), pp. 3-10. Fulltext not available.

Wastl, Daniel S. and Speck, Florian and Wutscher, Elisabeth and Ostler, Markus and Seyller, Thomas and Giessibl, Franz J. (2013) Observation of 4 nm Pitch Stripe Domains Formed by Exposing Graphene to Ambient Air. ACS Nano 7 (11), pp. 10032-10037. Fulltext not available.

Weymouth, Alfred J. and Meuer, Daniel and Mutombo, Pingo and Wutscher, Thorsten and Ondracek, Martin and Jelinek, Pavel and Giessibl, Franz J. (2013) Atomic Structure Affects the Directional Dependence of Friction. Physical Review Letters 111 (12), p. 126103. Fulltext not available.

Welker, Joachim and Weymouth, Alfred J. and Giessibl, Franz J. (2013) The Influence of Chemical Bonding Configuration on Atomic Identification by Force Spectroscopy. ACS NANO 7 (8), pp. 7377-7382. Fulltext not available.

Wutscher, Thorsten and Niebauer, Johannes and Giessibl, Franz J. (2013) Scanning probe microscope simulator for the assessment of noise in scanning probe microscopy controllers. Review of Scientific Instruments 84, 073704-1.
[img]
Preview

Pielmeier, Florian and Giessibl, Franz J. (2013) Spin Resolution and Evidence for Superexchange on NiO(001) Observed by Force Microscopy. Physical Review Letters (PRL) 110 (26), 266101-1-266101-5.
[img]
Preview

Giessibl, Franz J. (2013) Seeing the Reaction. Science 340 (6139), pp. 1417-1418.
[img]
Preview

Wastl, Daniel S. and Weymouth, Alfred J. and Giessibl, Franz J. (2013) Optimizing atomic resolution of force microscopy in ambient conditions. Physical Review B (PRB) 87 (24), 245415-1-245415-10.
[img]
Preview

Welker, Joachim and Giessibl, Franz J. (2013) Abbildung der Symmetrien chemischer Bindungen. , Regensburg.
[img]
Preview

Weymouth, Alfred Jay and Giessibl, Franz J. (2012) The effect of sample resistivity on Kelvin probe force microscopy. Applied Physics Letters 101, pp. 213105-1.
[img]
Preview

Ionescu, Andrei and Wutscher, Elisabeth and Brambilla, Eugenio and Schneider-Feyrer, Sibylle and Giessibl, Franz J. and Hahnel, Sebastian (2012) Influence of surface properties of resin-based composites on in vitro Streptococcus mutans biofilm development. European Journal Of Oral Sciences 120 (5), pp. 458-465. Fulltext not available.

Wutscher, Thorsten and Weymouth, Alfred J. and Giessibl, Franz J. (2012) Localization of the phantom force induced by the tunneling current. Physical Review B (PRB) 85 (19), 195426-1-195426-6.
[img]
Preview

Welker, Joachim and Giessibl, Franz J. (2012) Revealing the Angular Symmetry of Chemical Bonds by Atomic Force Microscopy. Science 336 (608), pp. 444-449.
[img]

Welker, Joachim and Illek, Esther and Giessibl, Franz J. (2012) Analysis of force-deconvolution methods in frequency-modulation atomic force microscopy. Beilstein Journal of Nanotechnology 3, pp. 238-248.
[img]
Preview

Schneiderbauer, Maximilian and Wastl, Daniel S. and Giessibl, Franz J. (2012) qPlus magnetic force microscopy in frequencymodulation mode with millihertz resolution. Beilstein Journal of Nanotechnology 3, pp. 174-178.
[img]
Preview

Giessibl, Franz J. and Pielmeier, Florian and Eguchi, Toyoaki and An, Toshu and Hasegawa, Yukio (2011) Comparison of force sensors for atomic force microscopy based on quartz tuning forks and length-extensional resonators. Physical Review B (PRB) 84 (12), 125409-1-125409-15.
[img]
Preview

Weymouth, Alfred J. and Wutscher, Thorsten and Welker, Joachim and Hofman, Thomas and Giessibl, Franz J. (2011) Phantom Force Induced by Tunneling Current: A Characterization on Si(111). Physical Review Letters (PRL) 106 (22), 226801-1-226801-4.
[img]
Preview

Ternes, Markus and González, César and Lutz, Christopher P. and Hapala, Prokop and Giessibl, Franz J. and Jelinek, Pavel and Heinrich, Andreas J. (2011) Interplay of Conductance, Force, and Structural Change in Metallic Point Contacts. Physical Review Letters (PRL) 106 (1), 016802-1-016802-4.
[img]
Preview

Welker, Joachim and de Faria Elsner, Frederico and Giessibl, Franz J. (2011) Application of the equipartition theorem to the thermal excitation of quartz tuning forks. Applied Physics Letters 99 (8), 084102.
[img]
Preview

Wutscher, Elisabeth and Giessibl, Franz J. (2011) Atomic force microscopy at ambient and liquid conditions with stiff sensors and small amplitudes. Review of Scientific Instruments 82 (9), 093703.
[img]
Preview

Wutscher, Thorsten and Giessibl, Franz J. (2011) Note: In situ cleavage of crystallographic oriented tips for scanning probe microscopy. Review of Scientific Instruments 82 (2), 026106.
[img]
Preview

Tung, Raimond C. and Wutscher, Thorsten and Martinez-Martin, David and Reifenberger, Ronald G. and Giessibl, Franz J. and Raman, Arvind (2010) Higher-order eigenmodes of qPlus sensors for high resolution dynamic atomic force microscopy. Journal of Applied Physics 107 (10), 104508-1-104508-8.
[img]
Preview

Hofmann, Thomas and Welker, Joachim and Giessibl, Franz J. (2010) Preparation of light-atom tips for scanning probe microscopy by explosive delamination. Journal of Vacuum Science & Technology B 28 (3), C4E28-C4E30.
[img]
Preview

Giessibl, Franz J. (2009) Auf die Spitze getrieben. Physik Journal 8 (11), pp. 20-21. Fulltext not available.

Gross, Leo and Mohn, Fabian and Meyer, Gerhard and Repp, Jascha and Giessibl, Franz J. (2009) Atomare Ladungszustände unter dem Rasterkraftmikroskop. Physik in unserer Zeit 40 (5), pp. 225-226. Fulltext not available.

Gross, Leo and Mohn, Fabian and Liljeroth, Peter and Repp, Jascha and Giessibl, Franz J. and Meyer, Gerhard (2009) Measuring the Charge State of an Adatom with Noncontact Atomic Force Microscopy. Science 324 (5933), pp. 1428-1431. Fulltext not available.

Morita, Seizo and Giessibl, Franz J. and Wiesendanger, Roland, eds. (2009) Noncontact Atomic Force Microscopy: Volume 2. NanoScience and Technology. Springer, Heidelberg, Berlin. ISBN Hardcover 978-3-642-01494-9; eBook ISBN 978-3-642-01495-6; Softcover ISBN: 978-3-642-26070-4. Fulltext not available.

Ternes, Markus and Heinrich, Andreas J. and Giessibl, Franz J. (2008) Wie viel Kraft ist nötig, um ein Atom zu bewegen? Physik in unserer Zeit 39 (3), pp. 111-112.
[img]
Preview

Ternes, Markus and Lutz, Christopher P. and Hirjibehedin, Cyrus F. and Giessibl, Franz J. and Heinrich, Andreas J. (2008) The Force Needed to Move an Atom on a Surface. Science 319 (5866), pp. 1066-1069.
[img]
Preview

Schmid, Martin and Mannhart, Jochen and Giessibl, Franz J. (2008) Searching atomic spin contrast on nickel oxide (001) by force microscopy. Physical Review B (PRB) 77 (4), 045402-1-045402-6.
[img]
Preview

Giessibl, Franz J. (2007) Ein atomarer Fingerabdruck. Physik Journal 6 (5), pp. 22-23. Fulltext not available.

Giessibl, Franz J. and Quate, Calvin F. (2006) Exploring the Nanoworld with Atomic Force Microscopy. Physics today 59 (12), pp. 44-50. Fulltext not available.

Giessibl, Franz J. (2006) Higher-harmonic atomic force microscopy. Surface and Interface Analysis 38 (12-13), pp. 1696-1701. Fulltext not available.

Schmid, Martin and Renner, Andreas and Giessibl, Franz J. (2006) Device for in situ cleaving of hard crystals. Review of Scientific Instruments 77 (3), 036101-1-036101-7.
[img]
Preview

Zotti, Linda A. and Hofer, Werner A. and Giessibl, Franz J. (2006) Electron scattering in scanning probe microscopy experiments. Chemical Physics Letters 420 (1-3), pp. 177-182.
[img]
Preview

Giessibl, Franz J. (2005) AFM's path to atomic resolution. Materials Today 8 (5), pp. 32-41.
[img]
Preview

Herz, Markus and Schiller, Christian H. and Giessibl, Franz J. and Mannhart, Jochen (2005) Simultaneous current-, force-, and work-function measurement with atomic resolution. Applied Physics Letters 86 (15), 153101-1-153101-3.
[img]
Preview

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen and Quate, Calvin F. (2005) Local Spectroscopy and Atomic Imaging of Tunneling Current, Forces, and Dissipation on Graphite. Physical Review Letters (PRL) 94 (5), 056101-1-056101-4.
[img]
Preview

Giessibl, Franz J. and Reichling, Michael (2005) Investigating atomic details of the CaF₂(111) surface with a qPlus sensor. Nanotechnology 16 (3), pp. 118-124.
[img]
Preview

Morita, Seizo and Giessibl, Franz J. and Sugawara, Yasuhiro and Hosoi, Hirotaka and Mukasa, Koichi and Sasahara, Akira and Onishi, Hiroshi (2005) 13. Noncontact Atomic Force Microscopy and its Related Topics. In: Bhushan, Bharat, (ed.) Nanotribology and Nanomechanics An Introduction. Springer, Berlin, pp. 385-411. ISBN 978-3-540-24267-3. Fulltext not available.

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen (2004) Force Microscopy with Light-Atom Probes. Science 305 (5682), pp. 380-383.
[img]
Preview

Giessibl, Franz J. and Hembacher, Stefan and Herz, Markus and Schiller, C. H. and Mannhart, Jochen (2004) Stability considerations and implementation of cantilevers allowing dynamic force microscopy with optimal resolution: the qPlus sensor. Nanotechnology 15 (2), pp. 79-86.
[img]
Preview

Giessibl, Franz J. (2004) Silicon and Its Vital Role in The Evolution of Scanning Probe Microscopy. In: Siffert, Paul and Krimmel, E. F., (eds.) Silicon : evolution and future of a technology. Springer, Berlin, pp. 191-204. ISBN 3-540-40546-1. Fulltext not available.

Giessibl, Franz J. (2003) Atomic Force Microscopy on Its Way to Adolescence. AIP Conference Proceedings 696 (1), pp. 60-67. Fulltext not available.

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen and Quate, Calvin F. (2003) Revealing the hidden atom in graphite by low-temperature atomic force microscopy. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 100 (22), pp. 12539-12542.
[img]
Preview

Giessibl, Franz J. (2003) Advances in Atomic Force Microscopy. Reviews of Modern Physics (RMP) 75 (3), pp. 949-983.
[img]
Preview

Herz, Markus and Giessibl, Franz J. and Mannhart, F. (2003) Probing the shape of atoms in real space. Physical Review B (PRB) 68 (4), 045301-1-045301-7.
[img]
Preview

Giessibl, Franz J. (2003) B2. Principle of High-Resolution Atomic Force Microscopy. In: Blügel, Stefan and Luysberg, Martina and Urban, Knut and Waser, Rainer, (eds.) Fundamentals of nanoelectronics : lecture manuscripts of the 34th spring school of the Department of Solid State Research / Forschungszentrum Jülich GmbH, Institut für Festkörperforschung. Schriften des Forschungszentrums Jülich : Reihe Materie und Material, 14 (B2). Forschungszentrum, Zentralbibliothek, Jülich. ISBN 3-89336-319-X. Fulltext not available.

Giessibl, Franz J. and Herz, Markus and Mannhart, Jochen (2002) Friction traced to the single atom. Proceedings of the National Academy of Sciences of the United States of America (PNAS) 99 (19), pp. 12006-12010.
[img]
Preview

Hembacher, Stefan and Giessibl, Franz J. and Mannhart, Jochen (2002) Evaluation of a force sensor based on a quartz tuning fork for operation at low temperatures and ultrahigh vacuum. Applied Surface Science 188 (3-4), pp. 445-449.
[img]
Preview

Giessibl, Franz J. (2002) 2. Principle of NC-AFM. In: Morita, Seizo and Wiesendanger, Roland and Meyer, Ernst, (eds.) Noncontact atomic force microscopy. Band 1. Nanoscience and technology (2). Springer, Berlin, pp. 11-46. ISBN 3-540-43117-9 . Fulltext not available.

Giessibl, Franz J. (2002) Pushing the Resolution Limits of the Force Microscope: from Steps to Atoms and Atomic Orbitals. In: Proceedings of the Scanning Probe Microscopy-2002 (SPM-2002) Workshop : 3 March - 6 March 2002, Nizhny Novgorod, Russia. Physics of low-dimensional structures, 2002,5/6 . VSV, Moskau, pp. 172-174. Fulltext not available.

Giessibl, Franz J. and Bielefeldt, Hartmut and Hembacher, Stefan and Mannhart, Jochen (2001) Imaging of atomic orbitals with the Atomic Force Microscope — experiments and simulations. Annalen der Physik 10 (11-12), pp. 887-910.
[img]
Preview

Giessibl, Franz J. (2001) Rasterkraftmikroskop sieht erstmals ins Innere des Atoms. Spektrum der Wissenschaft 2001 (April), pp. 12-14. Fulltext not available.

Giessibl, Franz J. and Hembacher, Stefan and Bielefeldt, Hartmut and Mannhart, Jochen (2001) Imaging silicon by atomic force microscopy with crystallographically oriented tips. Applied Physics A: Materials Science & Processing 72 (Suppl1), pp. 15-17.
[img]
Preview

Giessibl, Franz J. (2001) A direct method to calculate tip–sample forces from frequency shifts in frequency-modulation atomic force microscopy. Applied Physics Letters 78 (1), pp. 123-125.
[img]
Preview

Giessibl, Franz J. and Hembacher, Stefan and Bielefeldt, Hartmut and Mannhart, Jochen (2000) Subatomic Features on the Silicon (111)-(7×7) Surface Observed by Atomic Force Microscopy. Science 289 (5478), pp. 422-425.
[img]
Preview

Giessibl, Franz J. and Bielefeldt, Hartmut (2000) Physical interpretation of frequency-modulation atomic force microscopy. Physical Review B (PRB) 61 (15), pp. 9968-9971.
[img]
Preview

Giessibl, Franz J. (2000) Atomic resolution on Si(111)-(7×7) by noncontact atomic force microscopy with a force sensor based on a quartz tuning fork. Applied Physics Letters 76 (11), pp. 1470-1472.
[img]
Preview

Bielefeldt, Hartmut and Giessibl, Franz J. (1999) A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics. Surface Science 440 (3), L863-L867.
[img]
Preview

Giessibl, Franz J. and Bielefeldt, Hartmut and Hembacher, Stefan and Mannhart, Jochen (1999) Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy. Applied Surface Science 140 (3-4), pp. 352-357.
[img]
Preview

Giessibl, Franz J. (1999) Force Microscopy in Vacuum with Atomic Resolution. In: Kuk, Y. and Lyo, I.W. and Jeon, D. and Park, S. I., (eds.) Preliminary proceedings of STM : 10th Int'l Conference on Scanning Tunneling Microscopy/Spectroscopy and Related Proximal Probe Microscopy ; 19 - 23 July, 1999, Seoul, Korea. , pp. 19-20. Fulltext not available.

Giessibl, Franz J. (1998) High-speed force sensor for force microscopy and profilometry utilizing a quartz tuning fork. Applied Physics Letters 73 (26), pp. 3956-3958.
[img]
Preview

Giessibl, Franz J. (1997) Forces and frequency shifts in atomic-resolution dynamic-force microscopy. Physical Review B (PRB) 56 (24), pp. 16010-16015.
[img]
Preview

Giessibl, Franz J. and Tortonese, Marco (1997) Self-oscillating mode for frequency modulation noncontact atomic force microscopy. Applied Physics Letters 70 (19), pp. 2529-2531.
[img]
Preview

Giessibl, Franz J. (1995) Atomic Force Microscopy-(7x7) Surface by Atomic Force Microscopy. Science 267 (5194), pp. 68-71.
[img]
Preview

Giessibl, Franz J. (1994) Atomic Force Microscopy in Ultrahigh Vacuum. Japanese Journal of Applied Physics (JJAP) 33, Part 1 (6B), pp. 3726-3734. Fulltext not available.

Giessibl, Franz J. and Trafas, Brian M. (1994) Piezoresistive cantilevers utilized for scanning tunneling and scanning force microscope in ultrahigh vacuum. Review of Scientific Instruments 65 (6), pp. 1923-1929.
[img]
Preview

Giessibl, Franz J. and Binnig, Gerd (1992) Investigation of the (001) cleavage plane of potassium bromide with an atomic force microscope at 4.2 K in ultra-high vacuum. Ultramicroscopy 42-44 pt.1, pp. 281-289.
[img]
Preview

Giessibl, Franz J. and Binnig, Gerd (1992) Theory for an electrostatic imaging mechanism allowing atomic resolution of ionic crystals by atomic force microscopy. Physical Review B (PRB) 45 (23), 13815(R).
[img]
Preview

Giessibl, Franz J. and Gerber, Christoph and Binnig, Gerd (1991) A low‐temperature atomic force/scanning tunneling microscope for ultrahigh vacuum. Journal of Vacuum Science and Technology B 9 (2), pp. 984-988.
[img]
Preview

This list was generated on Fri Aug 26 07:00:55 2016 CEST.
  1. Homepage UR

University Library

Publication Server

Contact:

Publishing: oa@ur.de
Dissertations: dissertationen@ur.de
Research data: daten@ur.de
Contact persons